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Semiconductor measurement technology, April 1, 1977 to September 30, 1977

Author: W Murray Bullis
Publisher: [Washington] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980.
Series: NBS special publication, 400-45.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
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Additional Physical Format: Online version:
Semiconductor measurement technology, April 1, 1977 to September 30, 1977.
[Washington] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980
(OCoLC)689381321
Document Type: Book
All Authors / Contributors: W Murray Bullis
OCLC Number: 6826841
Description: vi, 36 pages : illustrations ; 26 cm.
Series Title: NBS special publication, 400-45.
Responsibility: W. Murray Bullis, editor.

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Primary Entity

<http://www.worldcat.org/oclc/6826841> # Semiconductor measurement technology, April 1, 1977 to September 30, 1977
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "6826841" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/24092365#Place/washington> ; # Washington
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/dcu> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/24092365#Topic/semiconducteurs_mesure> ; # Semiconducteurs--Mesure
   schema:about <http://experiment.worldcat.org/entity/work/data/24092365#Topic/semiconductors_measurement> ; # Semiconductors--Measurement
   schema:about <http://id.worldcat.org/fast/1112241> ; # Semiconductors--Measurement
   schema:about <http://dewey.info/class/621.38152/> ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/14886315> ; # W. Murray Bullis
   schema:datePublished "1980" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/24092365> ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/24092365#Series/nbs_special_publication> ; # NBS special publication ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/689381321> ;
   schema:name "Semiconductor measurement technology, April 1, 1977 to September 30, 1977"@en ;
   schema:productID "6826841" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/6826841#PublicationEvent/washington_u_s_dept_of_commerce_national_bureau_of_standards_for_sale_by_the_supt_of_docs_u_s_govt_print_off_1980> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/24092365#Agent/for_sale_by_the_supt_of_docs_u_s_govt_print_off> ; # For sale by the Supt. of Docs., U.S. Govt. Print. Off.
   schema:publisher <http://experiment.worldcat.org/entity/work/data/24092365#Agent/u_s_dept_of_commerce_national_bureau_of_standards> ; # U.S. Dept. of Commerce, National Bureau of Standards
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/6826841> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/24092365#Agent/for_sale_by_the_supt_of_docs_u_s_govt_print_off> # For sale by the Supt. of Docs., U.S. Govt. Print. Off.
    a bgn:Agent ;
   schema:name "For sale by the Supt. of Docs., U.S. Govt. Print. Off." ;
    .

<http://experiment.worldcat.org/entity/work/data/24092365#Agent/u_s_dept_of_commerce_national_bureau_of_standards> # U.S. Dept. of Commerce, National Bureau of Standards
    a bgn:Agent ;
   schema:name "U.S. Dept. of Commerce, National Bureau of Standards" ;
    .

<http://experiment.worldcat.org/entity/work/data/24092365#Series/nbs_special_publication> # NBS special publication ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/6826841> ; # Semiconductor measurement technology, April 1, 1977 to September 30, 1977
   schema:name "NBS special publication ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/24092365#Topic/semiconducteurs_mesure> # Semiconducteurs--Mesure
    a schema:Intangible ;
   schema:name "Semiconducteurs--Mesure"@en ;
    .

<http://id.worldcat.org/fast/1112241> # Semiconductors--Measurement
    a schema:Intangible ;
   schema:name "Semiconductors--Measurement"@en ;
    .

<http://viaf.org/viaf/14886315> # W. Murray Bullis
    a schema:Person ;
   schema:birthDate "1930" ;
   schema:familyName "Bullis" ;
   schema:givenName "W. Murray" ;
   schema:name "W. Murray Bullis" ;
    .

<http://www.worldcat.org/oclc/689381321>
    a schema:CreativeWork ;
   rdfs:label "Semiconductor measurement technology, April 1, 1977 to September 30, 1977." ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/6826841> ; # Semiconductor measurement technology, April 1, 1977 to September 30, 1977
    .


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