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Semiconductor measurement technology : progress report, July 1 to September 30, 1976

Author: W Murray Bullis; J Franklin Mayo-Wells; United States. National Bureau of Standards.
Publisher: [Washington] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978.
Series: NBS special publication, 400-36.
Edition/Format:   Print book : National government publication : EnglishView all editions and formats
Database:WorldCat
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Additional Physical Format: Online version:
United States. National Bureau of Standards.
Semiconductor measurement technology.
[Washington] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978
(OCoLC)607703591
Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: W Murray Bullis; J Franklin Mayo-Wells; United States. National Bureau of Standards.
OCLC Number: 4724793
Description: vi, 71 pages : illustrations ; 26 cm.
Series Title: NBS special publication, 400-36.
Responsibility: W. Murray Bullis and J. Franklin Mayo-Wells, editors.

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Primary Entity

<http://www.worldcat.org/oclc/4724793> # Semiconductor measurement technology : progress report, July 1 to September 30, 1976
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "4724793" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/501843850#Place/washington> ; # Washington
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/dcu> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/501843850#Topic/semiconducteurs_essais> ; # Semiconducteurs--Essais
    schema:about <http://id.worldcat.org/fast/1112261> ; # Semiconductors--Testing
    schema:about <http://dewey.info/class/602.1/> ;
    schema:about <http://id.loc.gov/authorities/subjects/sh85119917> ; # Semiconductors--Testing
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/14886315> ; # W. Murray Bullis
    schema:contributor <http://viaf.org/viaf/75121134> ; # J Franklin Mayo-Wells
    schema:creator <http://viaf.org/viaf/126653902> ; # United States. National Bureau of Standards.
    schema:datePublished "1978" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/501843850> ;
    schema:genre "National government publication"@en ;
    schema:genre "Government publication"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/501843850#Series/nbs_special_publication> ; # NBS special publication ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/607703591> ;
    schema:name "Semiconductor measurement technology : progress report, July 1 to September 30, 1976"@en ;
    schema:productID "4724793" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/4724793#PublicationEvent/washington_u_s_dept_of_commerce_national_bureau_of_standards_for_sale_by_the_supt_of_docs_u_s_govt_print_off_1978> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/501843850#Agent/u_s_dept_of_commerce_national_bureau_of_standards> ; # U.S. Dept. of Commerce, National Bureau of Standards
    schema:publisher <http://experiment.worldcat.org/entity/work/data/501843850#Agent/for_sale_by_the_supt_of_docs_u_s_govt_print_off> ; # For sale by the Supt. of Docs., U.S. Govt. Print. Off.
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/4724793> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/501843850#Agent/for_sale_by_the_supt_of_docs_u_s_govt_print_off> # For sale by the Supt. of Docs., U.S. Govt. Print. Off.
    a bgn:Agent ;
    schema:name "For sale by the Supt. of Docs., U.S. Govt. Print. Off." ;
    .

<http://experiment.worldcat.org/entity/work/data/501843850#Agent/u_s_dept_of_commerce_national_bureau_of_standards> # U.S. Dept. of Commerce, National Bureau of Standards
    a bgn:Agent ;
    schema:name "U.S. Dept. of Commerce, National Bureau of Standards" ;
    .

<http://experiment.worldcat.org/entity/work/data/501843850#Series/nbs_special_publication> # NBS special publication ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/4724793> ; # Semiconductor measurement technology : progress report, July 1 to September 30, 1976
    schema:name "NBS special publication ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/501843850#Topic/semiconducteurs_essais> # Semiconducteurs--Essais
    a schema:Intangible ;
    schema:name "Semiconducteurs--Essais"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85119917> # Semiconductors--Testing
    a schema:Intangible ;
    schema:name "Semiconductors--Testing"@en ;
    .

<http://id.worldcat.org/fast/1112261> # Semiconductors--Testing
    a schema:Intangible ;
    schema:name "Semiconductors--Testing"@en ;
    .

<http://viaf.org/viaf/126653902> # United States. National Bureau of Standards.
    a schema:Organization ;
    schema:name "United States. National Bureau of Standards." ;
    .

<http://viaf.org/viaf/14886315> # W. Murray Bullis
    a schema:Person ;
    schema:birthDate "1930" ;
    schema:familyName "Bullis" ;
    schema:givenName "W. Murray" ;
    schema:name "W. Murray Bullis" ;
    .

<http://viaf.org/viaf/75121134> # J Franklin Mayo-Wells
    a schema:Person ;
    schema:familyName "Mayo-Wells" ;
    schema:givenName "J. Franklin" ;
    schema:name "J Franklin Mayo-Wells" ;
    .

<http://www.worldcat.org/oclc/607703591>
    a schema:CreativeWork ;
    rdfs:label "Semiconductor measurement technology." ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/4724793> ; # Semiconductor measurement technology : progress report, July 1 to September 30, 1976
    .

<http://www.worldcat.org/title/-/oclc/4724793>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/4724793> ; # Semiconductor measurement technology : progress report, July 1 to September 30, 1976
    schema:dateModified "2016-08-10" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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