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Sensors, cameras, and systems for industrial/scientific applications XI : 19-21 January 2010, San Jose, California, United States

Author: Erik Bodegom; Valérie Nguyen; IS & T--the Society for Imaging Science and Technology.; SPIE (Society)
Publisher: Bellingham, Wash. : SPIE, ©2010.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 7536.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Electronic books
Congresses
Congrès
Additional Physical Format: Print version:
Sensors, cameras, and systems for industrial/scientific applications XI.
Bellingham, Wash. : SPIE, ©2010
(OCoLC)607043024
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Erik Bodegom; Valérie Nguyen; IS & T--the Society for Imaging Science and Technology.; SPIE (Society)
OCLC Number: 537194367
Notes: Title from PDF title screen (SPIE digital library, viewed March 3, 2010).
Description: 1 online resource : illustrations (some color).
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 7536.
Responsibility: Erik Bodegom, Valérie Nguyen, editors ; sponsored and published by IS & T--the Society for Imaging Science and Technology, [and] SPIE.

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