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Simulation-based analysis for NBTI degradation in combinational CMOS VLSI circuits

Author: Zdravko Georgiev
Publisher: Stuttgart Universitätsbibliothek der Universität Stuttgart 2013
Dissertation: Stuttgart, Universität Stuttgart, Masterarbeit
Edition/Format:   Thesis/dissertation : Document : Thesis/dissertation : eBook   Computer File : EnglishView all editions and formats
Database:WorldCat
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Material Type: Document, Thesis/dissertation, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Zdravko Georgiev
OCLC Number: 862298293
Description: Online-Ressource.
Responsibility: Zdravko Georgiev

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