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Size effects in thin films

Author: C R Tellier; A J Tosser
Publisher: Amsterdam ; New York : Elsevier, 1982.
Series: Thin films science and technology, 2.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical view of the field, and considers imperfection and impurity effects.
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Genre/Form: Electronic books
Aufsatzsammlung
Additional Physical Format: Print version:
Tellier, C.R. (Colette R.), 1947-
Size effects in thin films.
Amsterdam ; New York : Elsevier, 1982
(DLC) 82011445
(OCoLC)9016801
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: C R Tellier; A J Tosser
ISBN: 9781483289762 1483289761
OCLC Number: 609862976
Reproduction Notes: Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2010. MiAaHDL
Description: 1 online resource (ix, 310 pages) : illustrations.
Details: Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Contents: Front Cover; Size Effects in Thin Films; Copyright Page; Table of Contents; SCOPE AND APPROACH; CHAPTER 1. SIZE EFFECTS IN ELECTRICAL CONDUCTIVITY; 1. PRELIMINARY; 2. MODELS FOR ELECTRONIC SCATTERING AT EXTERNAL SURFACES; 3. MODELS FOR TOTAL METAL FILM CONDUCTIVITY; CHAPTER 2. SIZE EFFECTS IN GALVANOMAGNETIC PROPERTIES; 1. THEORETICAL FRAMEWORK; 2. EFFECT OF SURFACE SCATTERING; 3. EFFECTS OF SURFACE AND GRAIN BOUNDARY SCATTERINGS; 4. QUANTUM SIZE EFFECTS IN A TRANSVERSE QUANTIZING MAGNETIC FIELD; 5. HALL EFFECTS IN THIN FERROMAGNETIC FILMS.
Series Title: Thin films science and technology, 2.
Responsibility: C.R. Tellier and A.J. Tosser.

Abstract:

A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical view of the field, and considers imperfection and impurity effects.

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