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Smart structures and materials 2004. Smart sensor technology and measurement systems : 15-17 March 2004, San Diego, California, USA

Author: Eric UddDaniele InaudiSociety of Photo-optical Instrumentation Engineers.American Institute of Aeronautics and Astronautics.United States. Defense Advanced Research Projects Agency.All authors
Publisher: Bellingham, Wash. : SPIE, ©2004.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 5384.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
Smart structures and materials 2004. Smart sensor technology and measurement systems.
Bellingham, Wash. : SPIE, ©2004
(OCoLC)56123813
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Eric Udd; Daniele Inaudi; Society of Photo-optical Instrumentation Engineers.; American Institute of Aeronautics and Astronautics.; United States. Defense Advanced Research Projects Agency.; SPIE Digital Library.
OCLC Number: 56139880
Description: 1 online resource (viii, 342 pages) : illustrations.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 5384.
Other Titles: Smart sensor technology and measurement systems
Responsibility: Eric Udd, Daniele Inaudi, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by AIAA--American Institute of Aeronautics and Astronautics (USA) [and others] ; cooperating organizations, DARPA--Defense Advanced Research Projects Agency (USA) [and others].

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