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Soft errors : from particles to circuits

Author: Jean-Luc Autran; Daniela Munteanu
Publisher: Boca Raton, FL : CRC Press, [2015] ©20
Series: Devices, circuits, and systems.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits.
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Soft Errors.
CRC Pr I Llc 2015
(OCoLC)885231470
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Jean-Luc Autran; Daniela Munteanu
ISBN: 9781466590847 146659084X 1466590831 9781466590830
OCLC Number: 903644086
Description: 1 online resource : illustrations.
Contents: Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background; Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors; Chapter 3: Natural Radioactivity of Electronic Materials; Chapter 4: Alpha-Radiation Metrology in Electronic Materials; Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits; Chapter 6: Accelerated Tests; Chapter 7: Real-Time (Life) Testing. Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and CircuitsChapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes; Chapter 10: Scaling Effects and Their Implications for Soft Errors; Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study; Chapter 12: SOI, FinFET, and Emerging Devices.
Series Title: Devices, circuits, and systems.
Responsibility: Jean-Luc Autran, Daniela Munteanu.

Abstract:

This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits.

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"Soft Errors: From Particles to Circuits covers all aspects of the design, use, application, performance, and testing of parts, devices, and systems and addresses every perspective from an Read more...

 
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