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Software process dynamics and agility : International Conference on Software Process, ICSP 2007, Minneapolis, MN, USA, May 19-20, 2007 : proceedings

Author: Qing Wang; Dietmar Pfahl; David Mitchell Raffo
Publisher: Berlin ; New York : Springer, ©2007.
Series: Lecture notes in computer science, 4470.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:
This volume contains papers presented at the International Conference on Software Process (ICSP 2007) held in Minneapolis, USA, May 19-20, 2007. ICSP 2007 c- prised two successful series of process-related workshops, the International Workshop on Software Process Simulation and Modeling (ProSim) and the Software Process Workshop (SPW). The theme of ICSP 2007 was ?Coping with Software Process Dynamics and Ag- ity. ?  Read more...
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Genre/Form: Electronic books
Conference papers and proceedings
Electronic book
Congresses
Additional Physical Format: Print version:
International Conference on the Software Process (2007 : Minneapolis, Minn.).
Software process dynamics and agility.
Berlin ; New York : Springer, ©2007
(DLC) 2007925873
(OCoLC)127107489
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Qing Wang; Dietmar Pfahl; David Mitchell Raffo
ISBN: 9783540724261 3540724265 9783540724254 3540724257
OCLC Number: 191468757
Description: 1 online resource (xi, 346 pages) : illustrations.
Contents: Process content --
Process tools and metrics --
Process management --
Process representation, analysis and modeling --
Experience report --
Simulation modeling.
Series Title: Lecture notes in computer science, 4470.
Other Titles: International Conference on Software Process
ICSP 2007
Responsibility: Qing Wang, Dietmar Pfahl, David M. Raffo (eds.).

Abstract:

The 28 revised full papers presented together with the abstracts of two keynote addresses cover process content, process tools and metrics, process management, process representation, analysis and  Read more...

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