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Solid state imaging : [proceedings of the NATO Advanced Study Institute on Solid State Imaging, held in Louvain-la-Neuve, Belgium, September 3-12, 1975]

Author: Paul G Jespers; Fernand van de Wiele; Marvin H White
Publisher: Leyden : Noordhoff, 1976.
Series: NATO advanced study institutes series., Series E,, Applied sciences ;, no. 16.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

An Advanced Study Institute on solid-state imaging was held in Louvain-la-Neuve, Belgium on September 3-12, 1975 under the auspices of the Scientific Affairs Division of NATO.

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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
NATO Advanced Study Institute on Solid State Imaging (1975 : Louvain-la-Neuve, Belgium).
Solid state imaging.
Leyden : Noordhoff, 1976
(OCoLC)714734012
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Paul G Jespers; Fernand van de Wiele; Marvin H White
ISBN: 9028600469 9789028600461
OCLC Number: 2464309
Description: ix, 736 pages : illustrations ; 25 cm.
Contents: Section I: Introduction.- History of Solid-State Imaging.- Solid-State Imaging Applications.- Section II: Physics of Photosensors.- Anti-reflection Films and Multilayer Structures.- Photodiode Quantum Efficiency.- Bulk Trapping.- Surface Trapping.- Section III: Diode and Transistor Arrays.- Charge Storage Operation of Silicon Photodetectors.- XY Addressing.- Photodiode Sensor Arrays.- Phototransistor Arrays.- Section IV: CTD Arrays.- Charge Integration and Storage in MOS Photosensors.- to Charge-Coupled Devices.- Organization of Charge-Coupled Image Sensors.- Charge Transport without Traps.- Charge Transport with Traps.- Image Sensors Using Surface Channel Charge-Coupled Devices.- Buried Channel CCD's.- Peristaltic Charge-Coupled Devices.- Electrical Charge Injection into CCD's.- Section V: CID Arrays.- Charge-Injection Devices for Solid State Imaging.- Three-Terminal Charge-Injection Device.- Section VI: Signal Extraction.- Design of Solid-State Imaging Arrays.- Interlacing in Solid-State Image Sensors.- Amplifier and Amplifier Noise Considerations.- Principles of Low-Noise Signal Extraction from Photodiode Arrays.- Distributed Floating Gate Amplifier.- Fixed Pattern Noise and Cooled Photosensor Arrays.- Section VII: Systems.- Aliasing and MTF Effects in Photosensor Arrays.- Signal and Noise in the Display of Images.- Time Delay and Integration Image Sensors.- Solid State Infrared Imaging.- Low Light Level Performance of Charge-Coupled Area Imaging Devices.- Comparison of Solid-State Imagers and Electron Beam Scanning Imagers.- List of Participants.
Series Title: NATO advanced study institutes series., Series E,, Applied sciences ;, no. 16.
Responsibility: edited by Paul G. Jespers, Fernand van de Wiele, Marvin H. White.

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