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Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey

Author: O J Glembocki; Society of Photo-optical Instrumentation Engineers.; SPIE Digital Library.
Publisher: Bellingham, Wash., U.S.A. : The Society, ©1992.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 1678.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: (OCoLC)26322290
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: O J Glembocki; Society of Photo-optical Instrumentation Engineers.; SPIE Digital Library.
OCLC Number: 57198446
Reproduction Notes: Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2004. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Description: ix, 308 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 1678.
Responsibility: Orest J. Glembocki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.

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Primary Entity

<http://www.worldcat.org/oclc/57198446> # Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey
    a schema:Book, schema:MediaObject, schema:CreativeWork ;
   library:oclcnum "57198446" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/931085565#Place/bellingham_wash_u_s_a> ; # Bellingham, Wash., U.S.A.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/wau> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/931085565#Topic/spectrum_analysis> ; # Spectrum analysis
   schema:about <http://id.worldcat.org/fast/1112261> ; # Semiconductors--Testing
   schema:about <http://experiment.worldcat.org/entity/work/data/931085565#Topic/semiconductors_testing> ; # Semiconductors--Testing
   schema:about <http://id.worldcat.org/fast/1129108> ; # Spectrum analysis
   schema:bookFormat schema:EBook ;
   schema:contributor <http://experiment.worldcat.org/entity/work/data/931085565#Organization/spie_digital_library> ; # SPIE Digital Library.
   schema:contributor <http://viaf.org/viaf/53223920> ; # O. J. Glembocki
   schema:contributor <http://viaf.org/viaf/151856603> ; # Society of Photo-optical Instrumentation Engineers.
   schema:copyrightYear "1992" ;
   schema:datePublished "1992" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/931085565> ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:genre "Conference publication"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/931085565#Series/proceedings_of_spie_the_international_society_for_optical_engineering> ; # Proceedings of SPIE--the International Society for Optical Engineering ;
   schema:isPartOf <http://worldcat.org/issn/0277-786X> ; # Proceedings / SPIE--the International Society for Optical Engineering,
   schema:isSimilarTo <http://www.worldcat.org/oclc/26322290> ;
   schema:name "Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey"@en ;
   schema:productID "57198446" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/57198446#PublicationEvent/bellingham_wash_u_s_a_the_society_1992> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/931085565#Agent/the_society> ; # The Society
   schema:url <http://link.spie.org/PSISDG/1678/1> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/57198446> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/931085565#Place/bellingham_wash_u_s_a> # Bellingham, Wash., U.S.A.
    a schema:Place ;
   schema:name "Bellingham, Wash., U.S.A." ;
    .

<http://experiment.worldcat.org/entity/work/data/931085565#Series/proceedings_of_spie_the_international_society_for_optical_engineering> # Proceedings of SPIE--the International Society for Optical Engineering ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/57198446> ; # Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey
   schema:name "Proceedings of SPIE--the International Society for Optical Engineering ;" ;
    .

<http://id.worldcat.org/fast/1112261> # Semiconductors--Testing
    a schema:Intangible ;
   schema:name "Semiconductors--Testing"@en ;
    .

<http://id.worldcat.org/fast/1129108> # Spectrum analysis
    a schema:Intangible ;
   schema:name "Spectrum analysis"@en ;
    .

<http://viaf.org/viaf/151856603> # Society of Photo-optical Instrumentation Engineers.
    a schema:Organization ;
   schema:name "Society of Photo-optical Instrumentation Engineers." ;
    .

<http://viaf.org/viaf/53223920> # O. J. Glembocki
    a schema:Person ;
   schema:familyName "Glembocki" ;
   schema:givenName "O. J." ;
   schema:name "O. J. Glembocki" ;
    .

<http://worldcat.org/issn/0277-786X> # Proceedings / SPIE--the International Society for Optical Engineering,
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/57198446> ; # Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey
   schema:issn "0277-786X" ;
   schema:name "Proceedings / SPIE--the International Society for Optical Engineering," ;
    .

<http://www.worldcat.org/oclc/26322290>
    a schema:CreativeWork ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/57198446> ; # Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey
    .

<http://www.worldcat.org/title/-/oclc/57198446>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/57198446> ; # Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey
   schema:dateModified "2017-12-24" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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