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Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974

Author: James R Ehrstein; American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics.; United States. National Bureau of Standards.
Publisher: Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1974.
Series: Semiconductor measurement technology.; NBS special publication, 400-10.; ASTM special technical publication, 572.
Edition/Format:   Print book : Conference publication : National government publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
Spreading Resistance Symposium (1974 : Gaithersburg, Md.).
Spreading Resistance Symposium.
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1974
(OCoLC)632286795
Material Type: Conference publication, Government publication, National government publication
Document Type: Book
All Authors / Contributors: James R Ehrstein; American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics.; United States. National Bureau of Standards.
OCLC Number: 1573323
Notes: "Under the sponsorship of Committee F-1 of the American Society for Testing and Materials and the National Bureau of Standards."
Description: ix, 281 pages : illustrations ; 27 cm.
Series Title: Semiconductor measurement technology.; NBS special publication, 400-10.; ASTM special technical publication, 572.
Responsibility: James R. Ehrstein, editor.

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Primary Entity

<http://www.worldcat.org/oclc/1573323> # Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "1573323" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/dcu> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/291192628#Place/washington> ; # Washington
    schema:about <http://id.worldcat.org/fast/905874> ; # Electric resistance, Spreading
    schema:about <http://experiment.worldcat.org/entity/work/data/291192628#Topic/semiconductors_testing> ; # Semiconductors--Testing
    schema:about <http://dewey.info/class/389.08/> ;
    schema:about <http://id.worldcat.org/fast/1112261> ; # Semiconductors--Testing
    schema:about <http://experiment.worldcat.org/entity/work/data/291192628#Topic/resistance_electrique_congres> ; # Résistance électrique--Congrès
    schema:about <http://experiment.worldcat.org/entity/work/data/291192628#Topic/semiconducteurs_essais_congres> ; # Semiconducteurs--Essais--Congrès
    schema:about <http://id.loc.gov/authorities/subjects/sh85041987> ; # Electric resistance, Spreading
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/153611556> ; # American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics.
    schema:contributor <http://viaf.org/viaf/72666030> ; # James R. Ehrstein
    schema:contributor <http://viaf.org/viaf/126653902> ; # United States. National Bureau of Standards.
    schema:creator <http://experiment.worldcat.org/entity/work/data/291192628#Meeting/spreading_resistance_symposium_1974_gaithersburg_md> ; # Spreading Resistance Symposium (1974 : Gaithersburg, Md.)
    schema:datePublished "1974" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/291192628> ;
    schema:genre "Conference publication"@en ;
    schema:genre "Government publication"@en ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:genre "Congresses"@en ;
    schema:genre "National government publication"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/291192628#Series/nbs_special_publication> ; # NBS special publication ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/291192628#Series/semiconductor_measurement_technology> ; # Semiconductor measurement technology.
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/291192628#Series/astm_stp> ; # ASTM STP ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/291192628#Series/astm_special_technical_publication> ; # ASTM special technical publication ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/632286795> ;
    schema:name "Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974"@en ;
    schema:productID "1573323" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/1573323#PublicationEvent/washington_u_s_dept_of_commerce_national_bureau_of_standards_for_sale_by_the_supt_of_docs_u_s_govt_print_off_1974> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/291192628#Agent/u_s_dept_of_commerce_national_bureau_of_standards> ; # U.S. Dept. of Commerce, National Bureau of Standards
    schema:publisher <http://experiment.worldcat.org/entity/work/data/291192628#Agent/for_sale_by_the_supt_of_docs_u_s_govt_print_off> ; # For sale by the Supt. of Docs., U.S. Govt. Print. Off.
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/1573323> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/291192628#Agent/for_sale_by_the_supt_of_docs_u_s_govt_print_off> # For sale by the Supt. of Docs., U.S. Govt. Print. Off.
    a bgn:Agent ;
    schema:name "For sale by the Supt. of Docs., U.S. Govt. Print. Off." ;
    .

<http://experiment.worldcat.org/entity/work/data/291192628#Agent/u_s_dept_of_commerce_national_bureau_of_standards> # U.S. Dept. of Commerce, National Bureau of Standards
    a bgn:Agent ;
    schema:name "U.S. Dept. of Commerce, National Bureau of Standards" ;
    .

<http://experiment.worldcat.org/entity/work/data/291192628#Meeting/spreading_resistance_symposium_1974_gaithersburg_md> # Spreading Resistance Symposium (1974 : Gaithersburg, Md.)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/291192628#Place/gaithersburg_md> ; # Gaithersburg, Md.)
    schema:name "Spreading Resistance Symposium (1974 : Gaithersburg, Md.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/291192628#Place/gaithersburg_md> # Gaithersburg, Md.)
    a schema:Place ;
    schema:name "Gaithersburg, Md.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/291192628#Series/astm_special_technical_publication> # ASTM special technical publication ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/1573323> ; # Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974
    schema:name "ASTM special technical publication ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/291192628#Series/astm_stp> # ASTM STP ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/1573323> ; # Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974
    schema:name "ASTM STP ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/291192628#Series/nbs_special_publication> # NBS special publication ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/1573323> ; # Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974
    schema:name "NBS special publication ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/291192628#Series/semiconductor_measurement_technology> # Semiconductor measurement technology.
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/1573323> ; # Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974
    schema:name "Semiconductor measurement technology." ;
    schema:name "Semiconductor measurement technology" ;
    .

<http://experiment.worldcat.org/entity/work/data/291192628#Topic/resistance_electrique_congres> # Résistance électrique--Congrès
    a schema:Intangible ;
    schema:name "Résistance électrique--Congrès"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/291192628#Topic/semiconducteurs_essais_congres> # Semiconducteurs--Essais--Congrès
    a schema:Intangible ;
    schema:name "Semiconducteurs--Essais--Congrès"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85041987> # Electric resistance, Spreading
    a schema:Intangible ;
    schema:name "Electric resistance, Spreading"@en ;
    .

<http://id.worldcat.org/fast/1112261> # Semiconductors--Testing
    a schema:Intangible ;
    schema:name "Semiconductors--Testing"@en ;
    .

<http://id.worldcat.org/fast/905874> # Electric resistance, Spreading
    a schema:Intangible ;
    schema:name "Electric resistance, Spreading"@en ;
    .

<http://viaf.org/viaf/126653902> # United States. National Bureau of Standards.
    a schema:Organization ;
    schema:name "United States. National Bureau of Standards." ;
    .

<http://viaf.org/viaf/153611556> # American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics.
    a schema:Organization ;
    schema:name "American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics." ;
    .

<http://viaf.org/viaf/72666030> # James R. Ehrstein
    a schema:Person ;
    schema:familyName "Ehrstein" ;
    schema:givenName "James R." ;
    schema:name "James R. Ehrstein" ;
    .

<http://www.worldcat.org/oclc/632286795>
    a schema:CreativeWork ;
    rdfs:label "Spreading Resistance Symposium." ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/1573323> ; # Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974
    .

<http://www.worldcat.org/title/-/oclc/1573323>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/1573323> ; # Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974
    schema:dateModified "2018-06-06" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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