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Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974

Author: James R Ehrstein; American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics.; United States. National Bureau of Standards.
Publisher: Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1974.
Series: Semiconductor measurement technology.; NBS special publication, 400-10.; ASTM special technical publication, 572.
Edition/Format:   Print book : Conference publication : National government publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
Spreading Resistance Symposium (1974 : Gaithersburg, Md.).
Spreading Resistance Symposium.
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1974
(OCoLC)632286795
Material Type: Conference publication, Government publication, National government publication
Document Type: Book
All Authors / Contributors: James R Ehrstein; American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics.; United States. National Bureau of Standards.
OCLC Number: 1573323
Notes: "Under the sponsorship of Committee F-1 of the American Society for Testing and Materials and the National Bureau of Standards."
Description: ix, 281 pages : illustrations ; 27 cm.
Series Title: Semiconductor measurement technology.; NBS special publication, 400-10.; ASTM special technical publication, 572.
Responsibility: James R. Ehrstein, editor.

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