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Spurious symptom reduction in fault monitoring

Author: W D Shontz; R M Records; J J Chol; Langley Research Center.
Publisher: Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va.] : [National Technical Information Service, distributor], [1993]
Series: NASA contractor report, NASA CR-101453.
Edition/Format:   Book   Microform : National government publication : Microfiche : English
Database:WorldCat
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Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: W D Shontz; R M Records; J J Chol; Langley Research Center.
OCLC Number: 30619800
Notes: Distributed to depository libraries in microfiche.
Shipping list no.: 93-1216-M.
Reproduction Notes: Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1993]. 2 microfiches.
Description: 1 volume.
Series Title: NASA contractor report, NASA CR-101453.
Responsibility: W.D. Shontz, R.M. Records, J.J. Chol.

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