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Statistical analysis of reliability and life-testing models : theory and methods

Author: Lee J Bain; Max Engelhardt
Publisher: New York : M. Dekker, ©1991.
Series: Statistics, textbooks and monographs, v. 115.
Edition/Format:   Print book : English : 2nd edView all editions and formats
Summary:

A textbook for a methods course or reference for an experimenter who is mainly interested in data analyses rather than in the mathematical development of the procedures. It provides the useful  Read more...

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Document Type: Book
All Authors / Contributors: Lee J Bain; Max Engelhardt
ISBN: 0824785061 9780824785062
OCLC Number: 23144229
Description: vii, 496 pages : illustrations ; 24 cm.
Series Title: Statistics, textbooks and monographs, v. 115.
Responsibility: Lee J. Bain, Max Engelhardt.
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