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Statistical analysis of reliability and life-testing models : theory and methods

Author: Lee J Bain; Max Engelhardt
Publisher: New York : M. Dekker, ©1991.
Series: Statistics, textbooks and monographs, v. 115.
Edition/Format:   eBook : Document : English : 2nd edView all editions and formats
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Bain, Lee J., 1939-
Statistical analysis of reliability and life-testing models.
New York : M. Dekker, ©1991
(DLC) 91007832
(OCoLC)23144229
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Lee J Bain; Max Engelhardt
ISBN: 0585323453 9780585323459
OCLC Number: 45843847
Description: 1 online resource (vii, 496 pages) : illustrations.
Series Title: Statistics, textbooks and monographs, v. 115.
Responsibility: Lee J. Bain, Max Engelhardt.

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