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Statistical case studies for industrial process improvement

Author: Veronica Czitrom; Patrick D Spagon; Society for Industrial and Applied Mathematics.; American Statistical Association.
Publisher: Philadelphia, PA : Society for Industrial and Applied Mathematics ; Alexandria, Va. : American Statistical Association, ©1997.
Series: ASA-SIAM series on statistics and applied probability.
Edition/Format:   Print book : EnglishView all editions and formats
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Genre/Form: Case studies
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Veronica Czitrom; Patrick D Spagon; Society for Industrial and Applied Mathematics.; American Statistical Association.
ISBN: 0898713943 9780898713947
OCLC Number: 36681708
Description: xxvii, 514 pages : illustrations ; 26 cm + 2 computer discs (3 1/2 in.).
Details: System requirements for accompanying computer disks: IBM-compatible PC; Macintosh.
Series Title: ASA-SIAM series on statistics and applied probability.
Responsibility: Veronica Czitrom, Patrick D. Spagon.
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Primary Entity

<http://www.worldcat.org/oclc/36681708> # Statistical case studies for industrial process improvement
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "36681708" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/652313#Place/alexandria_va> ; # Alexandria, Va.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/pau> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/652313#Place/philadelphia_pa> ; # Philadelphia, PA
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/fiabilite_methodes_statistiques> ; # Fiabilité--Méthodes statistiques
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/semiconducteurs_industrie_methodes_statistiques_cas_etude_de> ; # Semiconducteurs--Industrie--Méthodes statistiques--Cas, Étude de
   schema:about <http://id.worldcat.org/fast/1112163> ; # Semiconductor industry--Statistical methods
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/semiconductor_industry_statistical_methods_case_studies> ; # Semiconductor industry--Statistical methods--Case studies
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/statistik> ; # Statistik
   schema:about <http://id.worldcat.org/fast/1078040> ; # Process control--Statistical methods
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/halbleiterindustrie> ; # Halbleiterindustrie
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/commande_de_processus_methodes_statistiques_cas_etudes_de> ; # Commande de processus--Méthodes statistiques--Cas, Études de
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/procedes_de_fabrication> ; # Procédés de fabrication
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/semiconducteurs_industrie_et_commerce_cas_etudes_de> ; # Semiconducteurs--Industrie et commerce--Cas, Études de
   schema:about <http://dewey.info/class/621.38150685/e21/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/fabrication_controle_methodes_statistiques_cas_etude_de> ; # Fabrication--Contrôle--Méthodes statistiques--Cas, Étude de
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/statistiques> ; # Statistiques
   schema:about <http://id.loc.gov/authorities/subjects/sh94006406> ; # Process control--Statistical methods
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/semiconductor_industry_statistical_methods> ; # Semiconductor industry--Statistical methods
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/process_control_statistical_methods_case_studies> ; # Process control--Statistical methods--Case studies
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/fallstudiensammlung> ; # Fallstudiensammlung
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/statistiques_tables> ; # Statistiques--Tables
   schema:about <http://experiment.worldcat.org/entity/work/data/652313#Topic/prozessoptimierung> ; # Prozessoptimierung
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/138967442> ; # Society for Industrial and Applied Mathematics.
   schema:contributor <http://viaf.org/viaf/279660540> ; # Patrick D. Spagon
   schema:contributor <http://viaf.org/viaf/156777717> ; # American Statistical Association.
   schema:copyrightYear "1997" ;
   schema:creator <http://viaf.org/viaf/73137043> ; # Veronica Czitrom
   schema:datePublished "1997" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/652313> ;
   schema:genre "Case studies"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/652313#Series/asa_siam_series_on_statistics_and_applied_probability> ; # ASA-SIAM series on statistics and applied probability.
   schema:name "Statistical case studies for industrial process improvement"@en ;
   schema:productID "36681708" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/36681708#PublicationEvent/philadelphia_pa_society_for_industrial_and_applied_mathematics_alexandria_va_american_statistical_association_1997> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/652313#Agent/american_statistical_association> ; # American Statistical Association
   schema:publisher <http://experiment.worldcat.org/entity/work/data/652313#Agent/society_for_industrial_and_applied_mathematics> ; # Society for Industrial and Applied Mathematics
   schema:url <http://catdir.loc.gov/catdir/enhancements/fy0726/97012582-t.html> ;
   schema:workExample <http://worldcat.org/isbn/9780898713947> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/36681708> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/652313#Agent/american_statistical_association> # American Statistical Association
    a bgn:Agent ;
   schema:name "American Statistical Association" ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Agent/society_for_industrial_and_applied_mathematics> # Society for Industrial and Applied Mathematics
    a bgn:Agent ;
   schema:name "Society for Industrial and Applied Mathematics" ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Place/alexandria_va> # Alexandria, Va.
    a schema:Place ;
   schema:name "Alexandria, Va." ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Place/philadelphia_pa> # Philadelphia, PA
    a schema:Place ;
   schema:name "Philadelphia, PA" ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Series/asa_siam_series_on_statistics_and_applied_probability> # ASA-SIAM series on statistics and applied probability.
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/36681708> ; # Statistical case studies for industrial process improvement
   schema:name "ASA-SIAM series on statistics and applied probability." ;
   schema:name "ASA-SIAM series on statistics and applied probability" ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/commande_de_processus_methodes_statistiques_cas_etudes_de> # Commande de processus--Méthodes statistiques--Cas, Études de
    a schema:Intangible ;
   schema:name "Commande de processus--Méthodes statistiques--Cas, Études de"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/fabrication_controle_methodes_statistiques_cas_etude_de> # Fabrication--Contrôle--Méthodes statistiques--Cas, Étude de
    a schema:Intangible ;
   schema:name "Fabrication--Contrôle--Méthodes statistiques--Cas, Étude de"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/fallstudiensammlung> # Fallstudiensammlung
    a schema:Intangible ;
   schema:name "Fallstudiensammlung"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/fiabilite_methodes_statistiques> # Fiabilité--Méthodes statistiques
    a schema:Intangible ;
   schema:name "Fiabilité--Méthodes statistiques"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/halbleiterindustrie> # Halbleiterindustrie
    a schema:Intangible ;
   schema:name "Halbleiterindustrie"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/procedes_de_fabrication> # Procédés de fabrication
    a schema:Intangible ;
   schema:name "Procédés de fabrication"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/process_control_statistical_methods_case_studies> # Process control--Statistical methods--Case studies
    a schema:Intangible ;
   schema:name "Process control--Statistical methods--Case studies"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/prozessoptimierung> # Prozessoptimierung
    a schema:Intangible ;
   schema:name "Prozessoptimierung"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/semiconducteurs_industrie_et_commerce_cas_etudes_de> # Semiconducteurs--Industrie et commerce--Cas, Études de
    a schema:Intangible ;
   schema:name "Semiconducteurs--Industrie et commerce--Cas, Études de"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/semiconducteurs_industrie_methodes_statistiques_cas_etude_de> # Semiconducteurs--Industrie--Méthodes statistiques--Cas, Étude de
    a schema:Intangible ;
   schema:name "Semiconducteurs--Industrie--Méthodes statistiques--Cas, Étude de"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/semiconductor_industry_statistical_methods> # Semiconductor industry--Statistical methods
    a schema:Intangible ;
   schema:hasPart <http://id.loc.gov/authorities/subjects/sh85119894> ;
   schema:name "Semiconductor industry--Statistical methods"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/semiconductor_industry_statistical_methods_case_studies> # Semiconductor industry--Statistical methods--Case studies
    a schema:Intangible ;
   schema:name "Semiconductor industry--Statistical methods--Case studies"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/652313#Topic/statistiques_tables> # Statistiques--Tables
    a schema:Intangible ;
   schema:name "Statistiques--Tables"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh94006406> # Process control--Statistical methods
    a schema:Intangible ;
   schema:name "Process control--Statistical methods"@en ;
    .

<http://id.worldcat.org/fast/1078040> # Process control--Statistical methods
    a schema:Intangible ;
   schema:name "Process control--Statistical methods"@en ;
    .

<http://id.worldcat.org/fast/1112163> # Semiconductor industry--Statistical methods
    a schema:Intangible ;
   schema:name "Semiconductor industry--Statistical methods"@en ;
    .

<http://viaf.org/viaf/138967442> # Society for Industrial and Applied Mathematics.
    a schema:Organization ;
   schema:name "Society for Industrial and Applied Mathematics." ;
    .

<http://viaf.org/viaf/156777717> # American Statistical Association.
    a schema:Organization ;
   schema:name "American Statistical Association." ;
    .

<http://viaf.org/viaf/279660540> # Patrick D. Spagon
    a schema:Person ;
   schema:familyName "Spagon" ;
   schema:givenName "Patrick D." ;
   schema:name "Patrick D. Spagon" ;
    .

<http://viaf.org/viaf/73137043> # Veronica Czitrom
    a schema:Person ;
   schema:familyName "Czitrom" ;
   schema:givenName "Veronica" ;
   schema:name "Veronica Czitrom" ;
    .

<http://worldcat.org/isbn/9780898713947>
    a schema:ProductModel ;
   schema:isbn "0898713943" ;
   schema:isbn "9780898713947" ;
    .


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