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Statistical techniques in life-testing, reliability, sampling theory and quality control

Author: B N Pandey
Publisher: New Delhi : Narosa Pub., ©2007.
Edition/Format:   Print book : EnglishView all editions and formats
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Additional Physical Format: Online version:
Statistical techniques in life-testing, reliability, sampling theory and quality control.
New Delhi : Narosa Pub., ©2007
(OCoLC)989683762
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: B N Pandey
ISBN: 8173197423 9788173197420
OCLC Number: 137302577
Description: viii, 215 pages : illustrations ; 25 cm
Contents: Preface / Estimation of variance in Type II Censored Data from Exponential Distribution under Asymmetric Loss Function / Further Variations on the Skew-Normal Theme / Properties of a Preliminary Test Estimator of an Inverse Gaussian Population Mean / Lognormal Model for Survival Data with Surviving Fraction / Methods of Estimation for Mean Assisted by a Finite Population Model / Patterns of Success and Failure in Bernoulli Trials / The Comparison of Some Nonparametric Two-Sample Location Tests under Population Variance Differences / Estimating HIV Infections Among Drug Abusers Using Randomized Responses / Analysis of X and R-charts when Standards Vary Randomly / Data-Analysis: Some Case Studies / On Testing Whether New is Better than Used of an Unknown Specified Age / Bayesian Estimation of the Scale of Gamma Distribution Using Precautionary Loss Function / Predictive Efficiency of Improved Estimators in Regression Models / Lattice Sampling without Sample Size Restriction / A Generalized Estimator in Restricted Regression Model when Disturbances are not Necessarily Normal / Profit Analysis of Reliability Models with Priority in Operation as well as in Repair / Estimation of the Ratio of the Two Population Means Using Multi-Auxiliary Characters in the Presence of Non-Response / A Class of Estimators for Post-Stratified Cluster Sampling / On Estimating Population Mean Using Auxiliary Information / Improved Estimation of Mean Life After Warranty in Exponential Failure Model / CSCC for Common Parameter of Several Exponential Distributions.
Responsibility: editor, B.N. Pandley.

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