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Stereology and morphometry in electron microscopy : problems and solutions

Author: Albrecht Reith; Terry M Mayhew
Publisher: New York : Hemisphere Pub. Corp., ©1988.
Series: Ultrastructural pathology publication series.
Edition/Format:   Print book : EnglishView all editions and formats
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Additional Physical Format: Online version:
Stereology and morphometry in electron microscopy.
New York : Hemisphere Pub. Corp., ©1988
(OCoLC)802300087
Document Type: Book
All Authors / Contributors: Albrecht Reith; Terry M Mayhew
ISBN: 0891166238 9780891166238
OCLC Number: 17327921
Description: xix, 215 pages : illustrations ; 24 cm.
Series Title: Ultrastructural pathology publication series.
Responsibility: edited by Albrecht Reith, Terry M. Mayhew ; with a foreword by Ewaed R. Weibel.

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