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Structure determination by X-ray crystallography

Author: M F C Ladd; R A Palmer
Publisher: New York : Plenum Press, ©1993.
Edition/Format:   Print book : English : 3rd edView all editions and formats
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Additional Physical Format: Online version:
Ladd, M.F.C. (Marcus Frederick Charles).
Structure determination by X-ray crystallography.
New York : Plenum Press, ©1993
(OCoLC)625017528
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: M F C Ladd; R A Palmer
ISBN: 0306442906 9780306442902
OCLC Number: 27012186
Description: xxiv, 586 pages : illustrations ; 24 cm
Contents: Physical Constants and Other Numerical Data --
Crystal Morphology and Crystal Symmetry --
The Crystalline State --
Stereographic Projection --
External Symmetry of Crystals --
Lattices and Space-Group Theory --
Lattices --
Families of Planes and Interplanar Spacings --
Reciprocal Lattice-Geometrical Treatment --
Unit-Cell Transformation --
Rotational Symmetries of Lattices --
Space Groups --
Matrix Representation of Symmetry Operations --
Diffraction Symbols --
I X-rays, X-ray Diffraction, and Structure Factors II Intensities and Intensity Statistics --
X-rays, X-ray Diffraction, and Structure Factors --
Generation and Properties of X-rays --
X-ray Scattering --
Scattering by Regular Arrays of Atoms --
Reciprocal Lattice-Analytical Treatment --
Scattering by a Crystal Structure --
Using the Structure Factor Equation --
Limiting Conditions and Systematic Absences --
Practical Determination of Space Groups from Diffraction Data --
Intensities and Intensity Statistics --
Intensity Expressions and Factors Affecting Intensities --
Intensity Statistics --
I Optical and X-ray Examination of Crystals II Measurement of Intensity Data from Single Crystals --
Optical and X-ray Examination of Crystals --
Polarized Light --
Optical Classification of Crystals --
Single-Crystal X-ray Techniques --
Recognition of Crystal System --
Measurement of Intensity Data from Single Crystals --
Intensity Measurements on Photographs --
Single-Crystal X-ray Diffractometry --
Area Detectors (Position-Sensitive Detectors) --
Monochromators --
Focusing Mirrors.
Responsibility: M.F.C. Ladd and R.A. Palmer.

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