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Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida

Author: Robert Lee Murrer; Society of Photo-optical Instrumentation Engineers.; SPIE Digital Library.
Publisher: Bellingham, Wash., USA : SPIE, ©1998.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 3368.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: (DLC) 99160760
(OCoLC)39685895
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Robert Lee Murrer; Society of Photo-optical Instrumentation Engineers.; SPIE Digital Library.
OCLC Number: 53834622
Reproduction Notes: Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Description: ix, 444 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 3368.
Other Titles: Hardware-in-the-loop testing III
Hardware-in-the-loop testing 3
Hardware-in-the-loop testing three
Responsibility: Robert Lee Murrer, Jr., chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering.

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