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Technologies for synthetic environments : hardware-in-the-loop testing X : 29-30 March, 2005, Orlando, Florida, USA

Author: Robert Lee Murrer; Society of Photo-optical Instrumentation Engineers.; Ball Aerospace & Technologies Corporation (USA)
Publisher: Bellingham, Wash. : SPIE, ©2005.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 5785.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Robert Lee Murrer; Society of Photo-optical Instrumentation Engineers.; Ball Aerospace & Technologies Corporation (USA)
ISBN: 0819457701 9780819457707
OCLC Number: 61183867
Description: xiii, 268 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 5785.
Other Titles: Hardware-in-the-loop testing X
Responsibility: Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, Ball Aerospace & Technologies Corporation (USA) [and others].

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