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Technologies for synthetic environments : hardware-in-the-loop testing X : 29-30 March 2005, Orlando, Florida, USA

Author: Robert Lee Murrer, Jr.; Society of Photo-optical Instrumentation Engineers.; Ball Aerospace & Technologies Corporation.; SPIE Digital Library.
Publisher: Bellingham, Wash. : SPIE, ©2005.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 5785.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: (OCoLC)61183867
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Robert Lee Murrer, Jr.; Society of Photo-optical Instrumentation Engineers.; Ball Aerospace & Technologies Corporation.; SPIE Digital Library.
ISBN: 0819457701 9780819457707
OCLC Number: 61190798
Reproduction Notes: Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2005. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Description: xiii, 268 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 5785.
Other Titles: Hardware-in-the-loop testing X
Responsibility: Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, Ball Aerospace & Technologies Corporation (USA) [and others].

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