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Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs)

Author: C E Schuster; United States. Defense Advanced Research Projects Agency.; Wright Laboratory (Wright-Patterson Air Force Base, Ohio); National Institute of Standards and Technology (U.S.)
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington : For sale by the Supt. of Docs., U.S. G.P.O., 1995.
Series: NIST special publication, 400-97.; Semiconductor measurement technology.
Edition/Format:   Book   Microform : National government publication : Microfiche : EnglishView all editions and formats
Database:WorldCat
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Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: C E Schuster; United States. Defense Advanced Research Projects Agency.; Wright Laboratory (Wright-Patterson Air Force Base, Ohio); National Institute of Standards and Technology (U.S.)
OCLC Number: 34871880
Notes: Distributed to depository libraries in microfiche.
Shipping list no.: 96-0273-M.
"September 1995."
Reproduction Notes: Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1996]. 2 microfiches : negative.
Description: iv, 88 pages : illustrations ; 28 cm.
Series Title: NIST special publication, 400-97.; Semiconductor measurement technology.
Responsibility: C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory.

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