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Testing of digital systems

Author: Niraj K Jha; S Gupta
Publisher: Cambridge : Cambridge University Press, 2003.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Jha, Niraj K.
Testing of digital systems.
Cambridge : Cambridge University Press, 2003
(OCoLC)48784338
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Niraj K Jha; S Gupta
ISBN: 0511077734 9780511077739 0511076169 9780511076169 9780511816321 0511816324 1282387138 9781282387133
OCLC Number: 57419693
Description: 1 online resource (xvi, 1000 pages) : illustrations
Contents: 1. Introduction / Ad van de Goor --
2. Fault models --
3. Combinational logic and fault simulation --
4. Test generation for combinational circuits --
5. Sequential ATPG --
6. I[subscript DDQ] testing --
7. Functional testing --
8. Delay fault testing --
9. CMOS testing --
10. Fault diagnosis --
11. Design for testability --
12. Built-in-self-test --
13. Synthesis for testability --
14. Memory testing / Ad van de Goor --
15. High-level test synthesis --
16. System-on-a-chip test synthesis.
Responsibility: N.K. Jha and S. Gupta.

Abstract:

The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and  Read more...

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