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Testing, reliability, and application of micro- and nano-material systems III : 8-10 March 2005, San Diego, California, USA

Author: Robert E Geer; Society of Photo-optical Instrumentation Engineers.; SPIE Digital Library.
Publisher: Bellingham, Wash. : SPIE, ©2005.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 5766.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Congresses
Additional Physical Format: (OCoLC)60639104
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Robert E Geer; Society of Photo-optical Instrumentation Engineers.; SPIE Digital Library.
ISBN: 0819457477 9780819457479
OCLC Number: 60660688
Reproduction Notes: Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2005. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Description: xi, 168 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 5766.
Responsibility: Robert E. Geer [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

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