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Testing, reliability, and applications of optoelectronic devices : 24-26 January, 2001, San Jose, [California] USA

Author: Aland K Chin
Publisher: Bellingham, Wash. : SPIE, ©2001.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 4285.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Aland K Chin
ISBN: 0819439630 9780819439635
OCLC Number: 47176425
Description: xxxii, 246 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 4285.
Responsibility: Aland K. Chin [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

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