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Tests in microfiche

作者: Educational Testing Service.
出版商: Princeton, N.J. : Educational Testing Service, 1975-
版本/格式:   期刊/雜誌 : 縮影單片 : 英語所有版本和格式的總覽
資料庫:WorldCat
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類型/形式: Periodicals
其他的實體格式: Online version:
Tests in microfiche
(OCoLC)693134687
文件類型: 期刊 / 雜誌 / 報紙
所有的作者/貢獻者: Educational Testing Service.
ISSN:0161-2573
OCLC系統控制編碼: 2694430
注意: Set B has title: Test collection.
One test per fiche, each with a distinctive title, with several tests comprising an annual set.
Annotated indexes appear annually, each covering one set.
描述: microfiches : negative, ill. + printed annotated indexes.
其他題名: Tests in microfiche
ETS test collection
Test collection
責任: ETS.

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連結資料


Primary Entity

<http://www.worldcat.org/oclc/2694430> # Tests in microfiche
    a schema:Periodical, bgn:Microform, schema:CreativeWork ;
    library:oclcnum "2694430" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nju> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1909008468#Place/princeton_n_j> ; # Princeton, N.J.
    schema:about <http://dewey.info/class/371.260973/> ;
    schema:about <http://id.worldcat.org/fast/917492> ; # Examinations
    schema:about <http://id.loc.gov/authorities/subjects/sh85046088> ; # Examinations--United States
    schema:about <http://id.worldcat.org/fast/903660> ; # Educational tests and measurements
    schema:about <http://id.worldcat.org/fast/1204155> ; # United States.
    schema:about <http://experiment.worldcat.org/entity/work/data/1909008468#Topic/educational_tests_and_measurements> ; # Educational tests and measurements
    schema:alternateName "Test collection" ;
    schema:alternateName "ETS test collection" ;
    schema:contributor <http://viaf.org/viaf/138255927> ; # Educational Testing Service.
    schema:datePublished "1975/" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/1909008468> ;
    schema:genre "Periodicals"@en ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/693134687> ;
    schema:name "Tests in microfiche"@en ;
    schema:productID "2694430" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/2694430#PublicationEvent/princeton_n_j_educational_testing_service_1975> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/1909008468#Agent/educational_testing_service> ; # Educational Testing Service
    schema:workExample <http://worldcat.org/issn/0161-2573> ; # Tests in microfiche
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/2694430> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1909008468#Agent/educational_testing_service> # Educational Testing Service
    a bgn:Agent ;
    schema:name "Educational Testing Service" ;
    .

<http://experiment.worldcat.org/entity/work/data/1909008468#Place/princeton_n_j> # Princeton, N.J.
    a schema:Place ;
    schema:name "Princeton, N.J." ;
    .

<http://id.loc.gov/authorities/subjects/sh85046088> # Examinations--United States
    a schema:Intangible ;
    schema:name "Examinations--United States"@en ;
    .

<http://id.worldcat.org/fast/1204155> # United States.
    a schema:Place ;
    schema:name "United States." ;
    .

<http://id.worldcat.org/fast/903660> # Educational tests and measurements
    a schema:Intangible ;
    schema:name "Educational tests and measurements"@en ;
    .

<http://id.worldcat.org/fast/917492> # Examinations
    a schema:Intangible ;
    schema:name "Examinations"@en ;
    .

<http://viaf.org/viaf/138255927> # Educational Testing Service.
    a schema:Organization ;
    schema:name "Educational Testing Service." ;
    .

<http://worldcat.org/issn/0161-2573> # Tests in microfiche
    a schema:Periodical ;
    schema:issn "0161-2573" ;
    schema:name "Tests in microfiche"@en ;
    umbel:isLike <http://worldcat.org/entity/work/id/1909008468> ;
    .

<http://www.worldcat.org/oclc/693134687>
    a schema:CreativeWork ;
    rdfs:label "Tests in microfiche" ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/2694430> ; # Tests in microfiche
    .


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