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Thermal shock testing for assuring reliability of glass-sealed microelectronic packages

Author: Walter B Thomas; Michael D Lewis; Goddard Space Flight Center.
Publisher: Greenbelt, Md. : National Aeronautics and Space Administration, Goddard Space Flight Center ; [Springfield, Va.] : [For sale by the National Technical Information Service], 1991.
Series: NASA technical memorandum, 104537.
Edition/Format:   Book   Microform : National government publication : Microfiche : English
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Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: Walter B Thomas; Michael D Lewis; Goddard Space Flight Center.
OCLC Number: 24664133
Notes: Distributed to depository libraries in microfiche.
Reproduction Notes: Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1991. 1 microfiche.
Description: 1 volume.
Series Title: NASA technical memorandum, 104537.
Responsibility: Walter B. Thomas III, Michael D. Lewis.

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