skip to content
Trace residue analysis : chemometric estimations of sampling, amount, and error Preview this item
ClosePreview this item
Checking...

Trace residue analysis : chemometric estimations of sampling, amount, and error

Author: David A Kurtz; American Chemical Society.
Publisher: Washington, D.C. : American Chemical Society, 1985.
Series: ACS symposium series, 284.
Edition/Format:   Print book : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Additional Physical Format: Online version:
Trace residue analysis.
Washington, D.C. : American Chemical Society, 1985
(OCoLC)610433101
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: David A Kurtz; American Chemical Society.
ISBN: 0841209251 9780841209251
OCLC Number: 12103322
Description: x, 284 pages : illustrations ; 24 cm.
Contents: Statistics : a child of our time? / Frauke Tschiltschke --
Sampling for chemical analysis of the environment : statistical considerations / B. Kratochvil --
Sampling and variance in measurements of trifluralin disappearance from a field soil / A.W. Taylor, J.H. Caro, H.P. Freeman, and B.C. Turner --
Processing outliers in statistical data / Johann A. Mühlbauer --
The many dimensions of detection in chemical analysis with special emphasis on the one-dimensional calibration curve / Lloyd A. Currie --
Introduction to the theory of correlation chromatography / Raymond Annino --
Developments in correlation chromatography : application in trace analysis / H.C. Smit --
Calibration-curve-based analysis : use of multiple-curve and weighted least-squares procedures with confidence band statistics / Douglas G. Mitchell --
The linear calibration graph and its confidence bands from regression on transformed data / David A. Kurtz, James L. Rosenberger, and Gwen J. Tamayo --
Use of cubic spline functions in solving calibration problems / Wolfhard Wegscheider --
Comparison of calibration graph amount and estimated amount intervals calculated from three research methods / David A. Kurtz --
Application of soft independent method of class analogy (SIMCA) in isomer specific analysis of polychlorinated biphenyls / D.L. Stalling, W.J. Dunn, III, T.R. Schwartz, J.W. Hogan, J.D. Petty, E. Johansson, and S. Wold --
From data to information to knowledge : the problems of metamorphosis / C. Zervos --
Panel discussion : advice to analytical chemists.
Series Title: ACS symposium series, 284.
Responsibility: David A. Kurtz, editor.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/12103322> # Trace residue analysis : chemometric estimations of sampling, amount, and error
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "12103322" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/864394054#Place/washington_d_c> ; # Washington, D.C.
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/dcu> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/864394054#Topic/chemische_analyses> ; # Chemische analyses
    schema:about <http://experiment.worldcat.org/entity/work/data/864394054#Topic/oligoelements_analyse_methodes_statistiques> ; # Oligoéléments - Analyse - Méthodes statistiques
    schema:about <http://dewey.info/class/543/e19/> ;
    schema:about <http://id.worldcat.org/fast/1153535> ; # Trace elements--Analysis--Statistical methods
    schema:about <http://experiment.worldcat.org/entity/work/data/864394054#Thing/trace_residue_analysis> ; # TRACE RESIDUE ANALYSIS
    schema:about <http://experiment.worldcat.org/entity/work/data/864394054#Topic/trace_elements_analysis_statistical_methods> ; # Trace elements--Analysis--Statistical methods
    schema:about <http://experiment.worldcat.org/entity/work/data/864394054#Topic/spurenanalyse> ; # Spurenanalyse
    schema:about <http://experiment.worldcat.org/entity/work/data/864394054#Topic/calibratie> ; # Calibratie
    schema:about <http://experiment.worldcat.org/entity/work/data/864394054#Topic/chemometrie> ; # Chemometrie
    schema:about <http://experiment.worldcat.org/entity/work/data/864394054#Topic/kongress> ; # Kongress
    schema:about <http://experiment.worldcat.org/entity/work/data/864394054#Topic/correlatiechromatografie> ; # Correlatiechromatografie
    schema:about <http://experiment.worldcat.org/entity/work/data/864394054#Thing/acs> ; # ACS
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/58046735> ; # David A. Kurtz
    schema:contributor <http://viaf.org/viaf/143644441> ; # American Chemical Society.
    schema:datePublished "1985" ;
    schema:description "Statistics : a child of our time? / Frauke Tschiltschke -- Sampling for chemical analysis of the environment : statistical considerations / B. Kratochvil -- Sampling and variance in measurements of trifluralin disappearance from a field soil / A.W. Taylor, J.H. Caro, H.P. Freeman, and B.C. Turner -- Processing outliers in statistical data / Johann A. Mühlbauer -- The many dimensions of detection in chemical analysis with special emphasis on the one-dimensional calibration curve / Lloyd A. Currie -- Introduction to the theory of correlation chromatography / Raymond Annino -- Developments in correlation chromatography : application in trace analysis / H.C. Smit -- Calibration-curve-based analysis : use of multiple-curve and weighted least-squares procedures with confidence band statistics / Douglas G. Mitchell -- The linear calibration graph and its confidence bands from regression on transformed data / David A. Kurtz, James L. Rosenberger, and Gwen J. Tamayo -- Use of cubic spline functions in solving calibration problems / Wolfhard Wegscheider -- Comparison of calibration graph amount and estimated amount intervals calculated from three research methods / David A. Kurtz -- Application of soft independent method of class analogy (SIMCA) in isomer specific analysis of polychlorinated biphenyls / D.L. Stalling, W.J. Dunn, III, T.R. Schwartz, J.W. Hogan, J.D. Petty, E. Johansson, and S. Wold -- From data to information to knowledge : the problems of metamorphosis / C. Zervos -- Panel discussion : advice to analytical chemists."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/864394054> ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://worldcat.org/issn/0097-6156> ; # ACS symposium series,
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/864394054#Series/acs_symposium_series> ; # ACS symposium series ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/610433101> ;
    schema:name "Trace residue analysis : chemometric estimations of sampling, amount, and error"@en ;
    schema:productID "12103322" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/12103322#PublicationEvent/washington_d_c_american_chemical_society_1985> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/864394054#Agent/american_chemical_society> ; # American Chemical Society
    schema:url <http://pubs.acs.org/doi/book/10.1021/bk-1985-0284> ;
    schema:workExample <http://worldcat.org/isbn/9780841209251> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/12103322> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/864394054#Agent/american_chemical_society> # American Chemical Society
    a bgn:Agent ;
    schema:name "American Chemical Society" ;
    .

<http://experiment.worldcat.org/entity/work/data/864394054#Place/washington_d_c> # Washington, D.C.
    a schema:Place ;
    schema:name "Washington, D.C." ;
    .

<http://experiment.worldcat.org/entity/work/data/864394054#Series/acs_symposium_series> # ACS symposium series ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/12103322> ; # Trace residue analysis : chemometric estimations of sampling, amount, and error
    schema:name "ACS symposium series ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/864394054#Thing/trace_residue_analysis> # TRACE RESIDUE ANALYSIS
    a schema:Thing ;
    schema:name "TRACE RESIDUE ANALYSIS" ;
    .

<http://experiment.worldcat.org/entity/work/data/864394054#Topic/chemische_analyses> # Chemische analyses
    a schema:Intangible ;
    schema:name "Chemische analyses"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/864394054#Topic/correlatiechromatografie> # Correlatiechromatografie
    a schema:Intangible ;
    schema:name "Correlatiechromatografie"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/864394054#Topic/oligoelements_analyse_methodes_statistiques> # Oligoéléments - Analyse - Méthodes statistiques
    a schema:Intangible ;
    schema:name "Oligoéléments - Analyse - Méthodes statistiques"@en ;
    schema:name "Oligoéléments--Analyse--Méthodes statistiques"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/864394054#Topic/trace_elements_analysis_statistical_methods> # Trace elements--Analysis--Statistical methods
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh85136388> ;
    schema:name "Trace elements--Analysis--Statistical methods"@en ;
    .

<http://id.worldcat.org/fast/1153535> # Trace elements--Analysis--Statistical methods
    a schema:Intangible ;
    schema:name "Trace elements--Analysis--Statistical methods"@en ;
    .

<http://pubs.acs.org/doi/book/10.1021/bk-1985-0284>
    rdfs:comment "Rutgers restricted" ;
    rdfs:comment "Full text available from ACS Symposium Series (1974-2012)" ;
    .

<http://viaf.org/viaf/143644441> # American Chemical Society.
    a schema:Organization ;
    schema:name "American Chemical Society." ;
    .

<http://viaf.org/viaf/58046735> # David A. Kurtz
    a schema:Person ;
    schema:birthDate "1932" ;
    schema:familyName "Kurtz" ;
    schema:givenName "David A." ;
    schema:name "David A. Kurtz" ;
    .

<http://worldcat.org/isbn/9780841209251>
    a schema:ProductModel ;
    schema:isbn "0841209251" ;
    schema:isbn "9780841209251" ;
    .

<http://worldcat.org/issn/0097-6156> # ACS symposium series,
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/12103322> ; # Trace residue analysis : chemometric estimations of sampling, amount, and error
    schema:issn "0097-6156" ;
    schema:name "ACS symposium series," ;
    .

<http://www.worldcat.org/oclc/610433101>
    a schema:CreativeWork ;
    rdfs:label "Trace residue analysis." ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/12103322> ; # Trace residue analysis : chemometric estimations of sampling, amount, and error
    .

<http://www.worldcat.org/title/-/oclc/12103322>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/12103322> ; # Trace residue analysis : chemometric estimations of sampling, amount, and error
    schema:dateModified "2018-01-08" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.