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Transmission Electron Microscopy of Semiconductor Nanostructures: Analysis of Composition and Strain State

Author: Andreas Rosenauer
Publisher: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg : Springer e-books, 2003.
Series: Springer Tracts in Modern Physics, 182
Edition/Format:   Computer file : Document : EnglishView all editions and formats
Database:WorldCat
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Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Andreas Rosenauer
ISBN: 9783540364078 3540364072
OCLC Number: 801024639
Notes: L'accès complet au document est possible pour les usagers de tous les établissements publics français (situés ou non sur le territoire français) ayant des missions d'enseignement supérieur et/ou de recherche, des établissements d'enseignement supérieur privés, des bibliothèques publiques.
Description: 1 online resource.
Series Title: Springer Tracts in Modern Physics, 182
Responsibility: by Andreas Rosenauer.

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