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Transmission electron microscopy : physics of image formation

Author: Ludwig Reimer; H Kohl
Publisher: New York, NY : Springer, ©2008.
Series: Springer series in optical sciences, v. 36.
Edition/Format:   Print book : English : 5th edView all editions and formats
Summary:
"Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of  Read more...
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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Ludwig Reimer; H Kohl
ISBN: 9780387400938 0387400931 9780387347585 0387347585
OCLC Number: 234146401
Description: xvi, 587 pages : illustrations ; 25 cm.
Contents: Introduction --
Particle optics of electrons --
Wave optics of electrons --
Elements of a transmission electron microscope --
Electron-specimen interactions --
Scattering and phase contrast for amorphous specimens --
Theory of electron diffraction --
Electron-diffraction modes and applications --
Imaging of crystalline specimens and their defects --
Elemental analysis by X-ray and election energy-loss spectroscopy --
Specimen damage by electron irradiation.
Series Title: Springer series in optical sciences, v. 36.
Responsibility: L. Reimer, H. Kohl.
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Abstract:

This text, the standard of the field, includes an overview of such topics as the theory of image and contrast formation as well as discussion of recent progress in the field, especially in the areas  Read more...

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From the reviews of the fifth edition:"A classical monograph on the physics of image formation, electron-specimen interactions, and image interpretation in transmission electron microscopy. ... the Read more...

 
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    schema:reviewBody ""Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated." "Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text."--book jacket." ;
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