skip to content
Trapping highly charged ions : fundamentals and applications Preview this item
ClosePreview this item
Checking...

Trapping highly charged ions : fundamentals and applications

Author: John Gillaspy
Publisher: Huntington, N.Y. : Nova Science Publishers, ©2001.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Document Type: Book
All Authors / Contributors: John Gillaspy
ISBN: 156072725X 9781560727255
OCLC Number: 42009394
Description: x, 481 pages : illustrations ; 27 cm
Contents: Introduction / John Gillaspy --
Fundamentals (the traps). 1. The Physics of Electron Beam Ion Traps / F.J. Currell. 2. The Berlin Electron Beam Ion / C. Biedermann, T. Fuchs and G. Fussmann / [and others]. 3. The Freiburg Electron Beam Ion Trap/Source Project: FreEBIT / J.R. Crespo Lopez-Urrutia, B. Bapat and A. Dorn / [et al.]. 4. Some Physical and Engineering Aspects of High Current EBIS / A. Pikin and K. Prelec. 5. ECR-based Atomic Collision Physics Research at ORNL MIRF / F.W. Meyer. 6. Electron Collision Experiments with Cold Ions in Storage Rings / R. Schuch. 7. Multiply-Charged Ion research Using Penning, Kingdon, and Paul Ion Traps / D.A. Church --
Applications.
Responsibility: John Gillaspy (editor).

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.

Similar Items

Related Subjects:(1)

Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/42009394> # Trapping highly charged ions : fundamentals and applications
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "42009394" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/27044201#Place/huntington_n_y> ; # Huntington, N.Y.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
   schema:about <http://id.worldcat.org/fast/1155493> ; # Trapped ions
   schema:about <http://dewey.info/class/539.723/e21/> ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/19015458> ; # John Gillaspy
   schema:copyrightYear "2001" ;
   schema:datePublished "2001" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/27044201> ;
   schema:inLanguage "en" ;
   schema:name "Trapping highly charged ions : fundamentals and applications"@en ;
   schema:productID "42009394" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/42009394#PublicationEvent/huntington_n_y_nova_science_publishers_2001> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/27044201#Agent/nova_science_publishers> ; # Nova Science Publishers
   schema:workExample <http://worldcat.org/isbn/9781560727255> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/42009394> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/27044201#Agent/nova_science_publishers> # Nova Science Publishers
    a bgn:Agent ;
   schema:name "Nova Science Publishers" ;
    .

<http://experiment.worldcat.org/entity/work/data/27044201#Place/huntington_n_y> # Huntington, N.Y.
    a schema:Place ;
   schema:name "Huntington, N.Y." ;
    .

<http://id.worldcat.org/fast/1155493> # Trapped ions
    a schema:Intangible ;
   schema:name "Trapped ions"@en ;
    .

<http://viaf.org/viaf/19015458> # John Gillaspy
    a schema:Person ;
   schema:familyName "Gillaspy" ;
   schema:givenName "John" ;
   schema:name "John Gillaspy" ;
    .

<http://worldcat.org/isbn/9781560727255>
    a schema:ProductModel ;
   schema:isbn "156072725X" ;
   schema:isbn "9781560727255" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.