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Trapping highly charged ions : fundamentals and applications

Author: John Gillaspy
Publisher: Huntington, N.Y. : Nova Science Publishers, ©2001.
Edition/Format:   Book : EnglishView all editions and formats
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Document Type: Book
All Authors / Contributors: John Gillaspy
ISBN: 156072725X 9781560727255
OCLC Number: 42009394
Description: x, 481 p. : ill. ; 27 cm.
Contents: Introduction / John Gillaspy --
Fundamentals (the traps). 1. The Physics of Electron Beam Ion Traps / F. J. Currell. 2. The Berlin Electron Beam Ion / C. Biedermann, T. Fuchs and G. Fussmann / [et al.]. 3. The Freiburg Electron Beam Ion Trap/Source Project: FreEBIT / J. R. Crespo Lopez-Urrutia, B. Bapat and A. Dorn / [et al.]. 4. Some Physical and Engineering Aspects of High Current EBIS / A. Pikin and K. Prelec. 5. ECR-based Atomic Collision Physics Research at ORNL MIRF / F. W. Meyer. 6. Electron Collision Experiments with Cold Ions in Storage Rings / R. Schuch. 7. Multiply-Charged Ion research Using Penning, Kingdon, and Paul Ion Traps / D. A. Church --
Applications.
Responsibility: John Gillaspy (editor).

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