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Truncated and censored samples : theory and applications

Author: A Clifford Cohen
Publisher: New York : M. Dekker, ©1991.
Series: Statistics, textbooks and monographs, v. 119.
Edition/Format:   Print book : EnglishView all editions and formats
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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: A Clifford Cohen
ISBN: 0824784472 9780824784478
OCLC Number: 23383180
Description: xiv, 312 pages : illustrations ; 24 cm.
Contents: 1. Introduction --
2. Singly truncated and singly censored samples from the normal distribution --
3. Multirestricted samples from the normal distribution --
4. Linear estimations --
5. Truncated and censored samples from the Weibull distribution --
6. Truncated and censored samples from the lognormal distribution --
7. Truncated and censored samples from the inverse Gaussian and the gamma distributions --
8. Truncated and censored samples from the exponential and the extreme value distributions --
9. Truncated and censored samples from the Rayleigh distribution --
10. Truncated and censored samples from the Pareto distribution --
11. Higher-moment estimates of Pearson distribution parameters from truncated samples --
12. Truncated and censored samples from bivariate and multivariate normal distributions --
13. Truncated and censored samples from discrete distributions --
14. Truncated attribute sampling and related topics.
Series Title: Statistics, textbooks and monographs, v. 119.
Responsibility: A. Clifford Cohen.
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