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Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : San Jose, CA, USA, March 9-11, 2004

Author: Components, Packaging & Manufacturing Technology Society.; National Institute of Standards and Technology (U.S.)
Publisher: Piscataway, N.J. : IEEE, ©2004.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Components, Packaging & Manufacturing Technology Society.; National Institute of Standards and Technology (U.S.)
ISBN: 078038363X 9780780383630 0780383648 9780780383647
OCLC Number: 55693725
Notes: " ... SEMI-THERM XX ... "p. iii.
Cover title.
"IEEE Catalog Number 04CH37545 Softbound Edition ; 04CD37545C CD-ROM Edition"--Page ii.
Description: 1 online resource ([xiv], 313 pages) : illustrations
Other Titles: Semiconductor Thermal Measurement and Management, 2004 IEEE Twentieth Annual IEEE (SEMI-THERM)
Semiconductor Thermal Measurement and Management Symposium
SEMI-THERM XX
Responsibility: IEEE Components, Packaging, and Manufacturing Technology Society, National Institute of Standards and Technology.

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