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TXYZ, a program for semiconductor IC thermal analysis

Author: John Albers; United States. National Bureau of Standards.
Publisher: Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1984.
Series: Semiconductor measurement technology.; NBS special publication, 400-76.
Edition/Format:   Print book : National government publication : EnglishView all editions and formats
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Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: John Albers; United States. National Bureau of Standards.
OCLC Number: 10868914
Notes: Final.
Distributed to depository libraries in microfiche.
"Issued April 1984."
Item 247 (microfiche).
Description: iv, 61 pages : illustrations ; 28 cm.
Series Title: Semiconductor measurement technology.; NBS special publication, 400-76.
Responsibility: John Albers.

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