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The tyranny of testing.

Author: Banesh Hoffmann
Publisher: [New York] Crowell-Collier [1962]
Edition/Format:   Print book : EnglishView all editions and formats
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Additional Physical Format: Online version:
Hoffmann, Banesh, 1906-1986.
Tyranny of testing.
[New York] : Crowell-Collier Press, 1962
(OCoLC)580775782
Online version:
Hoffmann, Banesh, 1906-1986.
Tyranny of testing.
[New York] : Crowell-Collier Press, 1962
(OCoLC)632022317
Document Type: Book
All Authors / Contributors: Banesh Hoffmann
OCLC Number: 1378957
Description: 223 pages

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Primary Entity

<http://www.worldcat.org/oclc/1378957> # The tyranny of testing.
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "1378957" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    schema:about <http://id.worldcat.org/fast/1081381> ; # Psychological tests
    schema:about <http://experiment.worldcat.org/entity/work/data/444899#Topic/tests_et_mesures_en_education> ; # Tests et mesures en éducation
    schema:about <http://dewey.info/class/371.26/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/444899#Topic/educational_tests_and_measurements> ; # Educational tests and measurements
    schema:about <http://experiment.worldcat.org/entity/work/data/444899#Topic/intelligence_tests> ; # Intelligence tests
    schema:about <http://id.worldcat.org/fast/903660> ; # Educational tests and measurements
    schema:bookFormat bgn:PrintBook ;
    schema:creator <http://viaf.org/viaf/41915499> ; # Banesh Hoffmann
    schema:datePublished "1962" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/444899> ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/580775782> ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/632022317> ;
    schema:name "The tyranny of testing."@en ;
    schema:productID "1378957" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/1378957#PublicationEvent/new_yorkcrowell_collier1962> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/444899#Agent/crowell_collier> ; # Crowell-Collier
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/1378957> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/444899#Agent/crowell_collier> # Crowell-Collier
    a bgn:Agent ;
    schema:name "Crowell-Collier" ;
    .

<http://experiment.worldcat.org/entity/work/data/444899#Topic/educational_tests_and_measurements> # Educational tests and measurements
    a schema:Intangible ;
    schema:name "Educational tests and measurements"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/444899#Topic/intelligence_tests> # Intelligence tests
    a schema:Intangible ;
    schema:name "Intelligence tests"@en ;
    schema:name "Intelligence Tests"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/444899#Topic/tests_et_mesures_en_education> # Tests et mesures en éducation
    a schema:Intangible ;
    schema:name "Tests et mesures en éducation"@fr ;
    .

<http://id.worldcat.org/fast/1081381> # Psychological tests
    a schema:Intangible ;
    schema:name "Psychological tests"@en ;
    .

<http://id.worldcat.org/fast/903660> # Educational tests and measurements
    a schema:Intangible ;
    schema:name "Educational tests and measurements"@en ;
    .

<http://viaf.org/viaf/41915499> # Banesh Hoffmann
    a schema:Person ;
    schema:birthDate "1906" ;
    schema:deathDate "1986" ;
    schema:familyName "Hoffmann" ;
    schema:givenName "Banesh" ;
    schema:name "Banesh Hoffmann" ;
    .

<http://www.worldcat.org/oclc/580775782>
    a schema:CreativeWork ;
    rdfs:label "Tyranny of testing." ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/1378957> ; # The tyranny of testing.
    .

<http://www.worldcat.org/oclc/632022317>
    a schema:CreativeWork ;
    rdfs:label "Tyranny of testing." ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/1378957> ; # The tyranny of testing.
    .


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