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Ultraviolet ground- and space-based measurements, models, and effects : 30 July-1 August 2001, San Diego, USA

Author: James R SlusserJay R HermanWei GaoSociety of Photo-optical Instrumentation Engineers.Langley Research Center.All authors
Publisher: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, 2002.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 4482.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: James R Slusser; Jay R Herman; Wei Gao; Society of Photo-optical Instrumentation Engineers.; Langley Research Center.; USDA UVB Monitoring and Research Program.; Earth Probe TOMS Program (U.S.)
ISBN: 0819441961 9780819441966
OCLC Number: 49587358
Notes: "Papers presented during the Conference on Ultraviolet Ground- and Space-based Measurements, Models, and Effects ... held ... as part of SPIE's International Symposium on Optical Science and Technology"--Page xi.
Description: xi, 474 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 4482.
Responsibility: James R. Slusser, Jay R. Herman, Wei Gao, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by NASA Langley Research Center (USA) ; cooperating organizations, U.S. Department of Agriculture, UV-B Monitoring and Research Program [and] NASA Goddard Space Flight Center, Earth Probe TOMS Program (USA).

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