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Understanding robust and exploratory data analysis

Author: David C Hoaglin; Frederick Mosteller; John W Tukey
Publisher: New York : Wiley, ©1983.
Series: Wiley series in probability and mathematical statistics., Applied probability and statistics.
Edition/Format:   Book : EnglishView all editions and formats
Database:WorldCat
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Additional Physical Format: Online version:
Understanding robust and exploratory data analysis.
New York : Wiley, c1983
(OCoLC)622135128
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: David C Hoaglin; Frederick Mosteller; John W Tukey
ISBN: 0471097772 9780471097778 0471384917 9780471384915
OCLC Number: 8495063
Description: xvi, 447 p. : ill. ; 24 cm.
Contents: 1. Stem-and-leaf displays / John D. Emerson and David C. Hoaglin --
2. Letter values: a set of selected order statistics / David C. Hoaglin --
3. Boxplots and batch comparison / John D. Emerson and Judith Strenio --
4. Transforming data / John D. Emerson and Michael A. Stoto --
5. Resistant lines for y versus x / John D. Emerson and David C. Hoaglin --
6. Analysis of two-way tables by medians / John D. Emerson and David C. Hoaglin --
7. Examining residuals / Colin Goodall --
8. Mathematical aspects of transformation / John D. Emerson --
9. Introduction to more refined estimators / David C. Hoaglin, Frederick Mosteller, and John W. Tukey --
10. Comparing location estimators: trimmed means, medians, and trimean / James L. Rosenberger and Mariam Gasko --
11. M-estimators of location: an outline of the theory / Colin Goodall --
12. Robust scales estimators and confidence intervals for location / Boris Iglewicz.
Series Title: Wiley series in probability and mathematical statistics., Applied probability and statistics.
Responsibility: edited by David C. Hoaglin, Frederick Mosteller, John W. Tukey.
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