aller au contenu
Unequal by design : high-stakes testing and the standardization of inequality Aperçu de cet ouvrage
FermerAperçu de cet ouvrage
Vérifiant…

Unequal by design : high-stakes testing and the standardization of inequality

Auteur : Wayne Au
Éditeur : New York ; London : Routledge, 2009.
Collection : Critical social thought.
Édition/format :   Print book : AnglaisVoir toutes les éditions et tous les formats
Base de données :WorldCat
Résumé :
"Unequal By Design critically examines high-stakes standardized testing in order to illuminate what is really at stake for students, teachers, and communities negatively affected by such testing. This thoughtful analysis traces standardized testing's origins in the Eugenics and Social Efficiency movements of the late 19th and early 20th centuries through its current use as the central tool for national educational  Lire la suite...
Évaluation :

(pas encore évalué) 0 avec des critiques - Soyez le premier.

Sujets
Plus comme ceci

 

Trouver un exemplaire dans la bibliothèque

&AllPage.SpinnerRetrieving; Recherche de bibliothèques qui possèdent cet ouvrage...

Détails

Type d’ouvrage : Ressource Internet
Format : Livre, Ressource Internet
Tous les auteurs / collaborateurs : Wayne Au
ISBN : 9780415990707 041599070X 9780415990714 0415990718 9780203892046 0203892046
Numéro OCLC : 212893600
Description : xii, 199 pages ; 24 cm.
Contenu : The zip code effect: educational inequality in the United States --
We are all widgets: standardized testing and the hegemonic logics of the educational assembly line --
The educational enterprise: NCLB, Neoliberalism, and the politics of equality --
Steerage at a distance: high-stakes testing and classroom control --
Devising inequality: high-stakes testing and the regulation of consciousness --
Standardizing inequality: the hidden curriculum of high-stakes testing.
Titre de collection : Critical social thought.
Responsabilité : Wayne Au.
Plus d’informations :

Résumé :

Examines high-stakes standardized testing in order to illuminate what is really at stake for students, teachers, and communities negatively affected by such testing. This title explores historical,  Lire la suite...

Critiques

Critiques éditoriales

Synopsis de l’éditeur

"If equity and transformation of current schooling conditions are to be attained, Unequal by design: high-stakes testing and the standardization of inequality is a beacon to help realize 'the Lire la suite...

 
Critiques d’utilisateurs
Récupération des critiques de GoodReads...
Récuperation des critiques DOGObooks…

Tags

Tous les tags des utilisateurs (5)

Voir les tags les plus utilisés sous forme de : liste de tags | nuage de tags

Confirmez cette demande

Vous avez peut-être déjà demandé cet ouvrage. Veuillez sélectionner OK si vous voulez poursuivre avec cette demande quand même.

Données liées


Primary Entity

<http://www.worldcat.org/oclc/212893600> # Unequal by design : high-stakes testing and the standardization of inequality
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "212893600" ;
    library:placeOfPublication <http://dbpedia.org/resource/London> ; # London
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    schema:about <http://id.worldcat.org/fast/903418> ; # Educational equalization
    schema:about <http://id.worldcat.org/fast/1204155> ; # United States.
    schema:about <http://id.worldcat.org/fast/903684> ; # Educational tests and measurements--Social aspects
    schema:about <http://experiment.worldcat.org/entity/work/data/802546271#Topic/test_bias_united_states> ; # Test bias--United States
    schema:about <http://id.worldcat.org/fast/1148197> ; # Test bias
    schema:about <http://id.loc.gov/authorities/subjects/sh2008102489> ; # Educational equalization--United States
    schema:about <http://experiment.worldcat.org/entity/work/data/802546271#Topic/soziale_ungleichheit> ; # Soziale Ungleichheit
    schema:about <http://experiment.worldcat.org/entity/work/data/802546271#Place/usa> ; # USA.
    schema:about <http://dewey.info/class/371.26013/e22/> ;
    schema:about <http://id.loc.gov/authorities/subjects/sh2009102759> ; # Educational tests and measurements--Social aspects--United States
    schema:about <http://experiment.worldcat.org/entity/work/data/802546271#Topic/schulleistungsmessung> ; # Schulleistungsmessung
    schema:bookFormat bgn:PrintBook ;
    schema:creator <http://viaf.org/viaf/70825494> ; # Wayne Au
    schema:datePublished "2009" ;
    schema:description "The zip code effect: educational inequality in the United States -- We are all widgets: standardized testing and the hegemonic logics of the educational assembly line -- The educational enterprise: NCLB, Neoliberalism, and the politics of equality -- Steerage at a distance: high-stakes testing and classroom control -- Devising inequality: high-stakes testing and the regulation of consciousness -- Standardizing inequality: the hidden curriculum of high-stakes testing."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/802546271> ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/802546271#Series/the_critical_social_thought_series> ; # The critical social thought series
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/802546271#Series/critical_social_thought> ; # Critical social thought.
    schema:name "Unequal by design : high-stakes testing and the standardization of inequality"@en ;
    schema:productID "212893600" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/212893600#PublicationEvent/new_york_london_routledge_2009> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/802546271#Agent/routledge> ; # Routledge
    schema:reviews <http://www.worldcat.org/title/-/oclc/212893600#Review/-8301221> ;
    schema:url <http://catdir.loc.gov/catdir/toc/ecip0812/2008008799.html> ;
    schema:workExample <http://worldcat.org/isbn/9780415990707> ;
    schema:workExample <http://worldcat.org/isbn/9780203892046> ;
    schema:workExample <http://worldcat.org/isbn/9780415990714> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/212893600> ;
    .


Related Entities

<http://dbpedia.org/resource/London> # London
    a schema:Place ;
    schema:name "London" ;
    .

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/802546271#Series/critical_social_thought> # Critical social thought.
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/212893600> ; # Unequal by design : high-stakes testing and the standardization of inequality
    schema:name "Critical social thought." ;
    .

<http://experiment.worldcat.org/entity/work/data/802546271#Series/the_critical_social_thought_series> # The critical social thought series
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/212893600> ; # Unequal by design : high-stakes testing and the standardization of inequality
    schema:name "The critical social thought series" ;
    .

<http://experiment.worldcat.org/entity/work/data/802546271#Topic/schulleistungsmessung> # Schulleistungsmessung
    a schema:Intangible ;
    schema:name "Schulleistungsmessung"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/802546271#Topic/soziale_ungleichheit> # Soziale Ungleichheit
    a schema:Intangible ;
    schema:name "Soziale Ungleichheit"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2008102489> # Educational equalization--United States
    a schema:Intangible ;
    schema:name "Educational equalization--United States"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2009102759> # Educational tests and measurements--Social aspects--United States
    a schema:Intangible ;
    schema:name "Educational tests and measurements--Social aspects--United States"@en ;
    .

<http://id.worldcat.org/fast/1148197> # Test bias
    a schema:Intangible ;
    schema:name "Test bias"@en ;
    .

<http://id.worldcat.org/fast/1204155> # United States.
    a schema:Place ;
    schema:name "United States." ;
    .

<http://id.worldcat.org/fast/903418> # Educational equalization
    a schema:Intangible ;
    schema:name "Educational equalization"@en ;
    .

<http://id.worldcat.org/fast/903684> # Educational tests and measurements--Social aspects
    a schema:Intangible ;
    schema:name "Educational tests and measurements--Social aspects"@en ;
    .

<http://viaf.org/viaf/70825494> # Wayne Au
    a schema:Person ;
    schema:birthDate "1972" ;
    schema:familyName "Au" ;
    schema:givenName "Wayne" ;
    schema:name "Wayne Au" ;
    .

<http://worldcat.org/isbn/9780203892046>
    a schema:ProductModel ;
    schema:description "ebook" ;
    schema:isbn "0203892046" ;
    schema:isbn "9780203892046" ;
    .

<http://worldcat.org/isbn/9780415990707>
    a pto:Acid-free_paper, schema:ProductModel ;
    schema:description "hb : alk. paper" ;
    schema:isbn "041599070X" ;
    schema:isbn "9780415990707" ;
    .

<http://www.worldcat.org/title/-/oclc/212893600>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/212893600> ; # Unequal by design : high-stakes testing and the standardization of inequality
    schema:dateModified "2015-04-16" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .

<http://www.worldcat.org/title/-/oclc/212893600#Review/-8301221>
    a schema:Review ;
    schema:itemReviewed <http://www.worldcat.org/oclc/212893600> ; # Unequal by design : high-stakes testing and the standardization of inequality
    schema:reviewBody ""Unequal By Design critically examines high-stakes standardized testing in order to illuminate what is really at stake for students, teachers, and communities negatively affected by such testing. This thoughtful analysis traces standardized testing's origins in the Eugenics and Social Efficiency movements of the late 19th and early 20th centuries through its current use as the central tool for national educational reform via No Child Left Behind. By exploring historical, social, economic, and educational aspects of testing, author Wayne Au demonstrates that these tests are not only premised on the creation of inequality, but that their structures are inextricably intertwined with social inequalities that exist outside of schools."--BOOK JACKET." ;
    .


Content-negotiable representations

Fermer la fenêtre

Veuillez vous identifier dans WorldCat 

Vous n’avez pas de compte? Vous pouvez facilement créer un compte gratuit.