跳到内容
Unequal by design : high-stakes testing and the standardization of inequality 预览资料
关闭预览资料
正在查...

Unequal by design : high-stakes testing and the standardization of inequality

著者: Wayne Au
出版商: New York ; London : Routledge, 2009.
丛书: Critical social thought.
版本/格式:   Print book : 英语查看所有的版本和格式
数据库:WorldCat
提要:
"Unequal By Design critically examines high-stakes standardized testing in order to illuminate what is really at stake for students, teachers, and communities negatively affected by such testing. This thoughtful analysis traces standardized testing's origins in the Eugenics and Social Efficiency movements of the late 19th and early 20th centuries through its current use as the central tool for national educational  再读一些...
评估:

(尚未评估) 0 附有评论 - 争取成为第一个。

主题
更多类似这样的

 

在图书馆查找

&AllPage.SpinnerRetrieving; 正在查找有这资料的图书馆...

详细书目

材料类型: 互联网资源
文件类型: 书, 互联网资源
所有的著者/提供者: Wayne Au
ISBN: 9780415990707 041599070X 9780415990714 0415990718 9780203892046 0203892046
OCLC号码: 212893600
描述: xii, 199 pages ; 24 cm.
内容: The zip code effect: educational inequality in the United States --
We are all widgets: standardized testing and the hegemonic logics of the educational assembly line --
The educational enterprise: NCLB, Neoliberalism, and the politics of equality --
Steerage at a distance: high-stakes testing and classroom control --
Devising inequality: high-stakes testing and the regulation of consciousness --
Standardizing inequality: the hidden curriculum of high-stakes testing.
丛书名: Critical social thought.
责任: Wayne Au.
更多信息:

摘要:

Examines high-stakes standardized testing in order to illuminate what is really at stake for students, teachers, and communities negatively affected by such testing. This title explores historical,  再读一些...

评论

社评

出版商概要

"If equity and transformation of current schooling conditions are to be attained, Unequal by design: high-stakes testing and the standardization of inequality is a beacon to help realize 'the 再读一些...

 
用户提供的评论
正在获取GoodReads评论...
正在检索DOGObooks的评论

标签

所有的用户标签 (5)

查看最热门的标签,展示的形式是: 标签列表 | 标签云(tag cloud)

确认申请

你可能已经申请过这份资料。如果还是想申请,请选确认。

链接数据


Primary Entity

<http://www.worldcat.org/oclc/212893600> # Unequal by design : high-stakes testing and the standardization of inequality
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "212893600" ;
    library:placeOfPublication <http://dbpedia.org/resource/London> ; # London
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    schema:about <http://id.worldcat.org/fast/903418> ; # Educational equalization
    schema:about <http://id.worldcat.org/fast/1204155> ; # United States.
    schema:about <http://id.worldcat.org/fast/903684> ; # Educational tests and measurements--Social aspects
    schema:about <http://experiment.worldcat.org/entity/work/data/802546271#Topic/test_bias_united_states> ; # Test bias--United States
    schema:about <http://id.worldcat.org/fast/1148197> ; # Test bias
    schema:about <http://id.loc.gov/authorities/subjects/sh2008102489> ; # Educational equalization--United States
    schema:about <http://experiment.worldcat.org/entity/work/data/802546271#Topic/soziale_ungleichheit> ; # Soziale Ungleichheit
    schema:about <http://experiment.worldcat.org/entity/work/data/802546271#Place/usa> ; # USA.
    schema:about <http://dewey.info/class/371.26013/e22/> ;
    schema:about <http://id.loc.gov/authorities/subjects/sh2009102759> ; # Educational tests and measurements--Social aspects--United States
    schema:about <http://experiment.worldcat.org/entity/work/data/802546271#Topic/schulleistungsmessung> ; # Schulleistungsmessung
    schema:bookFormat bgn:PrintBook ;
    schema:creator <http://viaf.org/viaf/70825494> ; # Wayne Au
    schema:datePublished "2009" ;
    schema:description "The zip code effect: educational inequality in the United States -- We are all widgets: standardized testing and the hegemonic logics of the educational assembly line -- The educational enterprise: NCLB, Neoliberalism, and the politics of equality -- Steerage at a distance: high-stakes testing and classroom control -- Devising inequality: high-stakes testing and the regulation of consciousness -- Standardizing inequality: the hidden curriculum of high-stakes testing."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/802546271> ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/802546271#Series/the_critical_social_thought_series> ; # The critical social thought series
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/802546271#Series/critical_social_thought> ; # Critical social thought.
    schema:name "Unequal by design : high-stakes testing and the standardization of inequality"@en ;
    schema:productID "212893600" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/212893600#PublicationEvent/new_york_london_routledge_2009> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/802546271#Agent/routledge> ; # Routledge
    schema:reviews <http://www.worldcat.org/title/-/oclc/212893600#Review/-8301221> ;
    schema:url <http://catdir.loc.gov/catdir/toc/ecip0812/2008008799.html> ;
    schema:workExample <http://worldcat.org/isbn/9780415990707> ;
    schema:workExample <http://worldcat.org/isbn/9780203892046> ;
    schema:workExample <http://worldcat.org/isbn/9780415990714> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/212893600> ;
    .


Related Entities

<http://dbpedia.org/resource/London> # London
    a schema:Place ;
    schema:name "London" ;
    .

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/802546271#Series/critical_social_thought> # Critical social thought.
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/212893600> ; # Unequal by design : high-stakes testing and the standardization of inequality
    schema:name "Critical social thought." ;
    .

<http://experiment.worldcat.org/entity/work/data/802546271#Series/the_critical_social_thought_series> # The critical social thought series
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/212893600> ; # Unequal by design : high-stakes testing and the standardization of inequality
    schema:name "The critical social thought series" ;
    .

<http://experiment.worldcat.org/entity/work/data/802546271#Topic/schulleistungsmessung> # Schulleistungsmessung
    a schema:Intangible ;
    schema:name "Schulleistungsmessung"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/802546271#Topic/soziale_ungleichheit> # Soziale Ungleichheit
    a schema:Intangible ;
    schema:name "Soziale Ungleichheit"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2008102489> # Educational equalization--United States
    a schema:Intangible ;
    schema:name "Educational equalization--United States"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2009102759> # Educational tests and measurements--Social aspects--United States
    a schema:Intangible ;
    schema:name "Educational tests and measurements--Social aspects--United States"@en ;
    .

<http://id.worldcat.org/fast/1148197> # Test bias
    a schema:Intangible ;
    schema:name "Test bias"@en ;
    .

<http://id.worldcat.org/fast/1204155> # United States.
    a schema:Place ;
    schema:name "United States." ;
    .

<http://id.worldcat.org/fast/903418> # Educational equalization
    a schema:Intangible ;
    schema:name "Educational equalization"@en ;
    .

<http://id.worldcat.org/fast/903684> # Educational tests and measurements--Social aspects
    a schema:Intangible ;
    schema:name "Educational tests and measurements--Social aspects"@en ;
    .

<http://viaf.org/viaf/70825494> # Wayne Au
    a schema:Person ;
    schema:birthDate "1972" ;
    schema:familyName "Au" ;
    schema:givenName "Wayne" ;
    schema:name "Wayne Au" ;
    .

<http://worldcat.org/isbn/9780203892046>
    a schema:ProductModel ;
    schema:description "ebook" ;
    schema:isbn "0203892046" ;
    schema:isbn "9780203892046" ;
    .

<http://worldcat.org/isbn/9780415990707>
    a pto:Acid-free_paper, schema:ProductModel ;
    schema:description "hb : alk. paper" ;
    schema:isbn "041599070X" ;
    schema:isbn "9780415990707" ;
    .

<http://www.worldcat.org/title/-/oclc/212893600>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/212893600> ; # Unequal by design : high-stakes testing and the standardization of inequality
    schema:dateModified "2015-06-11" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .

<http://www.worldcat.org/title/-/oclc/212893600#Review/-8301221>
    a schema:Review ;
    schema:itemReviewed <http://www.worldcat.org/oclc/212893600> ; # Unequal by design : high-stakes testing and the standardization of inequality
    schema:reviewBody ""Unequal By Design critically examines high-stakes standardized testing in order to illuminate what is really at stake for students, teachers, and communities negatively affected by such testing. This thoughtful analysis traces standardized testing's origins in the Eugenics and Social Efficiency movements of the late 19th and early 20th centuries through its current use as the central tool for national educational reform via No Child Left Behind. By exploring historical, social, economic, and educational aspects of testing, author Wayne Au demonstrates that these tests are not only premised on the creation of inequality, but that their structures are inextricably intertwined with social inequalities that exist outside of schools."--BOOK JACKET." ;
    .


Content-negotiable representations

关闭窗口

请登入WorldCat 

没有张号吗?很容易就可以 建立免费的账号.