skip to content
VLSI Test Symposium, 21st IEEE. Preview this item
ClosePreview this item
Checking...

VLSI Test Symposium, 21st IEEE.

Author: IEEE Computer Society Staff,
Publisher: Los Alamitos : IEEE Computer Society Press Piscataway : IEEE [distributor] Jan. 2003
Edition/Format:   eBook : Document : English
Database:WorldCat
Summary:
VTS 2003 is the twenty-first in a series of annual symposia that explore the state-of-the-art, and introduce innovative approaches, in the testing of electronic circuits and systems. The complexity of current generation ICs, combined with rapidly developing high density, high speed packaging and reduced design cycle time, has made it extremely difficult and expensive to comprehensively test electronic systems, and  Read more...
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Computer Society Staff,
ISBN: 9780769519241 0769519245
OCLC Number: 812656857
Target Audience: Scholarly & Professional
Description: 1 online resource (492 pages)

Abstract:

The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.  Read more...

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.

Similar Items

Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/812656857> # VLSI Test Symposium, 21st IEEE.
    a schema:Book, schema:MediaObject, schema:CreativeWork ;
    library:oclcnum "812656857" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/cau> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1171929280#Place/los_alamitos> ; # Los Alamitos
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1171929280#Place/piscataway> ; # Piscataway
    schema:about <http://experiment.worldcat.org/entity/work/data/1171929280#Topic/integrated_circuits_very_large_scale_integration> ; # Integrated Circuits--Very Large Scale Integration
    schema:bookFormat schema:EBook ;
    schema:contentRating "Scholarly & Professional" ;
    schema:creator <http://experiment.worldcat.org/entity/work/data/1171929280#Organization/ieee_computer_society_staff> ; # IEEE Computer Society Staff,
    schema:datePublished "Jan. 2003" ;
    schema:description "VTS 2003 is the twenty-first in a series of annual symposia that explore the state-of-the-art, and introduce innovative approaches, in the testing of electronic circuits and systems. The complexity of current generation ICs, combined with rapidly developing high density, high speed packaging and reduced design cycle time, has made it extremely difficult and expensive to comprehensively test electronic systems, and diagnose failed parts using traditional methods. This situation worsens as we move toward nanometer technologies."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/1171929280> ;
    schema:inLanguage "en" ;
    schema:name "VLSI Test Symposium, 21st IEEE."@en ;
    schema:productID "812656857" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/812656857#PublicationEvent/los_alamitos_ieee_computer_society_pressjan_2003piscataway_ieee_distributor> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/1171929280#Agent/ieee_distributor> ; # IEEE [distributor
    schema:publisher <http://experiment.worldcat.org/entity/work/data/1171929280#Agent/ieee_computer_society_press> ; # IEEE Computer Society Press
    schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=8533> ;
    schema:workExample <http://worldcat.org/isbn/9780769519241> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/812656857> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1171929280#Agent/ieee_computer_society_press> # IEEE Computer Society Press
    a bgn:Agent ;
    schema:name "IEEE Computer Society Press" ;
    .

<http://experiment.worldcat.org/entity/work/data/1171929280#Agent/ieee_distributor> # IEEE [distributor
    a bgn:Agent ;
    schema:name "IEEE [distributor" ;
    .

<http://experiment.worldcat.org/entity/work/data/1171929280#Organization/ieee_computer_society_staff> # IEEE Computer Society Staff,
    a schema:Organization ;
    schema:name "IEEE Computer Society Staff," ;
    .

<http://experiment.worldcat.org/entity/work/data/1171929280#Topic/integrated_circuits_very_large_scale_integration> # Integrated Circuits--Very Large Scale Integration
    a schema:Intangible ;
    schema:name "Integrated Circuits--Very Large Scale Integration"@en ;
    .

<http://worldcat.org/isbn/9780769519241>
    a schema:ProductModel ;
    schema:isbn "0769519245" ;
    schema:isbn "9780769519241" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.