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VLSI Test Symposium (VTS 2000) : 18th IEEE.

Author: IEEE Computer Society Staff,
Publisher: Los Alamitos : IEEE Computer Society Press May 2000.
Edition/Format:   eBook : Document : English
Database:WorldCat
Summary:
Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift  Read more...
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Details

Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Computer Society Staff,
ISBN: 9780769506135 0769506135
OCLC Number: 812656854
Description: 1 online resource (478 pages)

Abstract:

These papers constitute the proceedings of the IEEE VLSI Test Symposium 2000. Subjects covered include: microprocessor test/validation; low power BIST and scan; defect driven techniques; analogue  Read more...

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