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VLSI testing : digital and mixed analogue/digital techniques

Author: S L Hurst
Publisher: London : Institution of Electrical Engineers, ©1998.
Series: IEE circuits and systems series, 9.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:

A comprehensive introduction and reference for all aspects of IC testing, this book includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and  Read more...

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Genre/Form: Electronic books
Additional Physical Format: Print version:
Hurst, S.L. (Stanley Leonard).
VLSI testing.
London : Institution of Electrical Engineers, ©1998
(OCoLC)38423379
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: S L Hurst
OCLC Number: 605208640
Reproduction Notes: Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2010. MiAaHDL
Description: 1 online resource (xx, 532 pages) : illustrations.
Details: Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Contents: Chapter 1: IntroductionChapter 2: Faults in digital circuitsChapter 3: Digital test pattern generationChapter 4: Signatures and self testChapter 5: Structured design for testability (DFT) techniquesChapter 6: Testing of structured digital circuits and microprocessorsChapter 7: Analogue testingChapter 8: Mixed analogue/digital system testChapter 9: The economics of test and final overall summaryAppendices
Series Title: IEE circuits and systems series, 9.
Responsibility: Stanley L. Hurst.

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'The book covers the important aspects of VLSI testing, introduces a significant number of testing methods and strategies and is a valuable book on VLSI testing.' * Measurement, Science & Technology * Read more...

 
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