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X-ray imaging II : 21-22 August 1986, San Diego, California

Author: Larry V Knight; D Keith Bowen; University of Rochester. Institute of Optics.; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1986.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 691.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
X-ray imaging II.
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1986
(OCoLC)563116117
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Larry V Knight; D Keith Bowen; University of Rochester. Institute of Optics.; Society of Photo-optical Instrumentation Engineers.
ISBN: 0892527269 9780892527267
OCLC Number: 14440114
Description: vi, 149 pages : illustrations (some color) ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 691.
Responsibility: Larry V. Knight, D. Keith Bowen, chairmen/editors ; cooperating organizations, Institute of Optics/University of Rochester [and others].

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