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X-ray spectrometry in electron beam instruments

Author: David B Williams; Joseph Goldstein; Dale E Newbury
Publisher: New York : Plenum Press, ©1995.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction,  Read more...

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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: David B Williams; Joseph Goldstein; Dale E Newbury
ISBN: 0306448580 9780306448584
OCLC Number: 31782404
Language Note: English.
Description: xviii, 372 pages : illustrations ; 26 cm
Contents: Ch. 1. The Development of Energy Dispersive Electron Probe Analysis / K.F.J. Heinrich --
Ch. 2. Problems and Trends in X-Ray Detector Design for Microanalysis / B.G. Lowe --
Ch. 3. Current Trends in Si(Li) Detector Windows for Light Element Analysis / M.W. Lund --
Ch. 4. Germanium X-Ray Detectors / R.A. Sareen --
Ch. 5. Modeling the Energy Dispersive X-Ray Detector / D.C. Joy --
Ch. 6. The Effect of Detector Dead Layers on Light Element Detection / J.J. McCarthy --
Ch. 7. Energy Dispersive X-Ray Spectrometry in Ultra-high Vacuum Environments / J.R. Michael --
Ch. 8. Quantifying Benefits of Resolution and Count Rate in EDX Microanalysis / P.J. Statham --
Ch. 9. Improving EDS Performance with Digital Pulse Processing / R.B. Mott and J.J. Friel --
Ch. 10. A Study of Systematic Errors in Multiple Linear Regression Peak Fitting Using Generated Spectra / C.R. Swyt. Ch. 11. Artifacts in Energy Dispersive X-Ray Spectrometry in Electron Beam Instruments. Are Things Getting Any Better? / D.E. Newbury --
Ch. 12. Characterizing an Energy Dispersive Spectrometer on an Analytical Electron Microscope / S.M. Zemyan and D.B. Williams --
Ch. 13. Wavelength Dispersive Spectrometry: A Review / S.J.B. Reed --
Ch. 14. Synthetic Multilayer Crystals for EPMA of Ultra-light Elements / G.F. Bastin and H.J.M. Heijligers --
Ch. 15. A von Hamos-Type Parallel Collection Wavelength Dispersive Spectrometer for Microbeam Analysis / A.M. Panin and M.W. Lund --
Ch. 16. Fitting Wavelength Dispersive Spectra with the NIST/NIH DTSA Program / R.L. Myklebust --
Ch. 17. Application of Layered Synthetic Microstructure Crystals to WDX Microanalysis of Ultra-light Elements / R. Rybka and R.C. Wolf --
Ch. 18. An Evaluation of Quantitative Electron Probe Methods / K.F.J. Heinrich.
Responsibility: edited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury.
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`[A] rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension.' from the Foreword by Peter Duncumb, University of Cambridge, England `Contains Read more...

 
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