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X-ray wavelengths for spectrometer : Bragg angles for crystals, ADP, EDT, quartz 6.68, Si, NaCl, LiF, quartz 2.75, topaz ; including x-ray absorption edges and all principle x-ray emission lines. Preview this item
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X-ray wavelengths for spectrometer : Bragg angles for crystals, ADP, EDT, quartz 6.68, Si, NaCl, LiF, quartz 2.75, topaz ; including x-ray absorption edges and all principle x-ray emission lines.

Author: General Electric Company. X-Ray Department.
Publisher: Milwaukee, Wis. : X-Ray Dept., General Electric, ©1959.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Tables
Additional Physical Format: Online version:
X-ray wavelengths for spectrometer.
Milwaukee, Wis. : X-Ray Dept., General Electric, ©1959
(OCoLC)707078145
Document Type: Book
All Authors / Contributors: General Electric Company. X-Ray Department.
OCLC Number: 2009972
Notes: Cat. no. A4961DA.
Description: viii, 448 pages ; 29 cm

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