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Yield and reliability in microwave circuit and system design

Author: Michael D Meehan; John Purviance
Publisher: Boston : Artech House, ©1993.
Series: Artech House microwave library.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

A reference for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different  Read more...

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Details

Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Michael D Meehan; John Purviance
ISBN: 0890065276 9780890065273
OCLC Number: 26552926
Description: xviii, 276 pages : illustrations ; 24 cm.
Contents: The Economics of Yield and Reliability Design --
Background Terminology and Scope --
The Design and Development Process --
Design and Development for Manufacturability --
Testing Model --
Specifications --
Elements of the Test Model --
Failure Mechanisms --
Manufacturing Model --
Definition of High Yield --
Ways To Achieve High Yield --
Parameter Aging and Environmental Model --
Design --
Single-Point Optimization Design Approach --
Extending Single-Point Procedures With Statistical Design --
Sources of Parameter Value Uncertainty --
When To Use Statistical Circuit Design --
Voltage Divider --
Low-Frequency Operational Amplifier --
High-Frequency Amplifier --
Examples of Statistical Circuit Design --
Butterworth Filter --
A 2- to 6-GHz Feedback Amplifier --
Satellite-Receiver System --
Tunable Active Filter --
Yield --
Two Ways To Describe Yield --
Mathematical Viewpoint: Calculating Yield --
Geometric Viewpoint: Seeing Yield --
Parameter Space and Performance Space --
Parameter Vector, P --
Parameter Space, P --
The Performance Space M, and the Measurement Vector M --
Design Specification, S --
Acceptable Performance Region, M[subscript a] --
Performance Function G(P) --
Acceptability Region in Parameter Space, P[subscript a] --
Example--A Voltage Divider --
Tolerance Region, T --
Parameter Statistics --
Random Variables --
Probability Density Function, f[subscript p](P) --
Average or Nominal Value --
Variance --
Higher-Order Moments --
Uniqueness --
Multiple Random Parameters and Their Joint PDF --
Covariance Matrix.
Series Title: Artech House microwave library.
Responsibility: Michael D. Meehan and John Purviance.

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