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Yield and Variability Optimization of Integrated Circuits

Author: J C Zhang; M A Styblinski
Publisher: Boston, MA : Springer US, 1995.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization,  Read more...
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Details

Genre/Form: Electronic books
Additional Physical Format: Print version:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: J C Zhang; M A Styblinski
ISBN: 9781461522256 1461522250
OCLC Number: 852791619
Description: 1 online resource (xvii, 234 pages)
Contents: 1 Introduction --
1.1 Design for Quality and Manufacturability --
1.2 Notation --
1.3 Interpretation of Basic Concepts --
1.4 Summary --
2 Overview of IC Statistical Modeling --
2.1 Introduction --
2.2 Process Variations --
2.3 Environmental Variations --
2.4 Statistical Macromodeling --
2.5 Summary --
3 Design of Experiments --
3.1 Introduction --
3.2 Experiment Analysis --
3.3 Orthogonal Arrays --
3.4 Main Effect Analysis --
3.5 Interaction Analysis --
3.6 Taguchi Experiments --
3.7 Summary --
4 Parametric Yield Maximization --
4.1 Introduction --
4.2 Yield Estimation --
4.3 Indirect Yield Improvement --
4.4 Direct Yield Optimization Methods --
4.5 Generalized and Orthogonal Array-Based Gradient Methods for Discrete Circuits --
4.6 Gradient Methods for Integrated Circuits --
4.7 Examples --
4.8 Summary --
5 Variability Minimization and Tuning --
5.1 Introduction --
5.2 Principles of Discrete Circuit Variability Minimization --
5.3 Principles of IC Variability Minimization --
5.4 Factor Screening --
5.5 Taguchi's on-target Design --
5.6 Two-Stage Design Strategy --
5.7 Example 4: CMOS Delay Circuit --
5.8 Example 5: CMOS Clock Driver --
5.9 Summary --
6 Worst-Case Measure Reduction --
6.1 Introduction --
6.2 The ±? Transistor Modeling --
6.3 Worst-Case Measure Minimization --
6.4 Comments on the ±? Model --
6.5 Creation of Worst-Case Models From the Statistical Model --
6.6 Summary --
7 Multi-Objective Circuit Optimization --
7.1 Introduction --
7.2 Multiple-Objective Optimization: An Overview --
7.3 Fuzzy Sets --
7.4 Multiple-Performance Statistical Optimization --
7.5 Multiple-Performance Variability Minimization --
7.6 Summary --
References.
Responsibility: by J.C. Zhang, M.A. Styblinski.

Abstract:

Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance  Read more...

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Primary Entity

<http://www.worldcat.org/oclc/852791619> # Yield and Variability Optimization of Integrated Circuits
    a schema:MediaObject, schema:CreativeWork, schema:Book ;
   library:oclcnum "852791619" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/mau> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/33654622#Place/boston_ma> ; # Boston, MA
   schema:about <http://dewey.info/class/621.3815/e23/> ;
   schema:about <http://id.worldcat.org/fast/872078> ; # Computer engineering
   schema:about <http://id.worldcat.org/fast/1141455> ; # Systems engineering
   schema:about <http://id.worldcat.org/fast/910312> ; # Engineering
   schema:bookFormat schema:EBook ;
   schema:contributor <http://viaf.org/viaf/279521145> ; # M. A. Styblinski
   schema:creator <http://experiment.worldcat.org/entity/work/data/33654622#Person/zhang_j_c> ; # J. C. Zhang
   schema:datePublished "1995" ;
   schema:description "Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. It also covers such topics as device statistical and worst-case modeling, design of experiments and factor screening, together with some basic tenets of fuzzy set theory and multi-objective statistical optimization. Several practical examples are used to familiarize the reader with the concepts, and demonstrate the applicability of various statistical circuit design methodologies. Yield and Variability Optimization of Integrated Circuits is intended as introductory reference material for various groups of IC designers, and the methodologies described provide an understanding of the complex problems of statistical circuit design, thus helping to enhance the overall quality of the ICs delivered to the customers."@en ;
   schema:description "1 Introduction -- 1.1 Design for Quality and Manufacturability -- 1.2 Notation -- 1.3 Interpretation of Basic Concepts -- 1.4 Summary -- 2 Overview of IC Statistical Modeling -- 2.1 Introduction -- 2.2 Process Variations -- 2.3 Environmental Variations -- 2.4 Statistical Macromodeling -- 2.5 Summary -- 3 Design of Experiments -- 3.1 Introduction -- 3.2 Experiment Analysis -- 3.3 Orthogonal Arrays -- 3.4 Main Effect Analysis -- 3.5 Interaction Analysis -- 3.6 Taguchi Experiments -- 3.7 Summary -- 4 Parametric Yield Maximization -- 4.1 Introduction -- 4.2 Yield Estimation -- 4.3 Indirect Yield Improvement -- 4.4 Direct Yield Optimization Methods -- 4.5 Generalized and Orthogonal Array-Based Gradient Methods for Discrete Circuits -- 4.6 Gradient Methods for Integrated Circuits -- 4.7 Examples -- 4.8 Summary -- 5 Variability Minimization and Tuning -- 5.1 Introduction -- 5.2 Principles of Discrete Circuit Variability Minimization -- 5.3 Principles of IC Variability Minimization -- 5.4 Factor Screening -- 5.5 Taguchi's on-target Design -- 5.6 Two-Stage Design Strategy -- 5.7 Example 4: CMOS Delay Circuit -- 5.8 Example 5: CMOS Clock Driver -- 5.9 Summary -- 6 Worst-Case Measure Reduction -- 6.1 Introduction -- 6.2 The ±? Transistor Modeling -- 6.3 Worst-Case Measure Minimization -- 6.4 Comments on the ±? Model -- 6.5 Creation of Worst-Case Models From the Statistical Model -- 6.6 Summary -- 7 Multi-Objective Circuit Optimization -- 7.1 Introduction -- 7.2 Multiple-Objective Optimization: An Overview -- 7.3 Fuzzy Sets -- 7.4 Multiple-Performance Statistical Optimization -- 7.5 Multiple-Performance Variability Minimization -- 7.6 Summary -- References."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/33654622> ;
   schema:genre "Electronic books"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://worldcat.org/entity/work/data/33654622#CreativeWork/> ;
   schema:name "Yield and Variability Optimization of Integrated Circuits"@en ;
   schema:productID "852791619" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/852791619#PublicationEvent/boston_ma_springer_us_1995> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/33654622#Agent/springer_us> ; # Springer US
   schema:url <http://link.springer.com/10.1007/978-1-4615-2225-6> ;
   schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=3080208> ;
   schema:url <http://dx.doi.org/10.1007/978-1-4615-2225-6> ;
   schema:workExample <http://dx.doi.org/10.1007/978-1-4615-2225-6> ;
   schema:workExample <http://worldcat.org/isbn/9781461522256> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/852791619> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/33654622#Person/zhang_j_c> # J. C. Zhang
    a schema:Person ;
   schema:familyName "Zhang" ;
   schema:givenName "J. C." ;
   schema:name "J. C. Zhang" ;
    .

<http://id.worldcat.org/fast/1141455> # Systems engineering
    a schema:Intangible ;
   schema:name "Systems engineering"@en ;
    .

<http://id.worldcat.org/fast/872078> # Computer engineering
    a schema:Intangible ;
   schema:name "Computer engineering"@en ;
    .

<http://id.worldcat.org/fast/910312> # Engineering
    a schema:Intangible ;
   schema:name "Engineering"@en ;
    .

<http://link.springer.com/10.1007/978-1-4615-2225-6>
   rdfs:comment "from Springer" ;
   rdfs:comment "(Unlimited Concurrent Users)" ;
    .

<http://viaf.org/viaf/279521145> # M. A. Styblinski
    a schema:Person ;
   schema:familyName "Styblinski" ;
   schema:givenName "M. A." ;
   schema:name "M. A. Styblinski" ;
    .

<http://worldcat.org/entity/work/data/33654622#CreativeWork/>
    a schema:CreativeWork ;
   schema:description "Print version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/852791619> ; # Yield and Variability Optimization of Integrated Circuits
    .

<http://worldcat.org/isbn/9781461522256>
    a schema:ProductModel ;
   schema:isbn "1461522250" ;
   schema:isbn "9781461522256" ;
    .


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