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原子力顯微鏡專利地圖及分析 = Patent analysis of atomic force microscope /
Yuan zi li xian wei jing zhuan li di tu ji fen xi = Patent analysis of atomic force microscope

Author: 汪島軍. 汪島軍等作. ; Dao-jun Wang
Publisher: 行政院國家科學委員會科學技術資料中心, Tai bei shi : Xing zheng yuan guo jia ke xue wei yuan hui ke xue ji shu zi liao zhong xin, min 93.
Series: Nai mi ke ji zhuan li yan jiu xi lie., Di ba ji ;, STIC-RPR-093-04.
Edition/Format:   Print book : Biography : National government publication : Chinese : Di yi banView all editions and formats
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Material Type: Biography, Government publication, National government publication
Document Type: Book
All Authors / Contributors: 汪島軍. 汪島軍等作. ; Dao-jun Wang
ISBN: 9576191173 9576191173 9789576191176
OCLC Number: 259810331
Description: 125 p. : cai tu ; 30 cm.
Series Title: Nai mi ke ji zhuan li yan jiu xi lie., Di ba ji ;, STIC-RPR-093-04.
Responsibility: Wang dao jun deng zuo.

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