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Zero defects; a new dimension in quality assurance

Author: James F Halpin
Publisher: New York, McGraw-Hill [1966]
Edition/Format:   Print book : EnglishView all editions and formats
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Additional Physical Format: Online version:
Halpin, James F.
Zero defects.
New York, McGraw-Hill [1966]
(OCoLC)567983091
Document Type: Book
All Authors / Contributors: James F Halpin
OCLC Number: 174315
Description: xii, 228 pages illustrations, portraits 24 cm
Responsibility: [by] James F. Halpin.

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Linked Data


Primary Entity

<http://www.worldcat.org/oclc/174315> # Zero defects; a new dimension in quality assurance
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "174315" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
   library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
   schema:about <http://id.worldcat.org/fast/1084966> ; # Quality control
   schema:about <http://experiment.worldcat.org/entity/work/data/1305431#Topic/control_de_calidad> ; # Control de calidad
   schema:about <http://dewey.info/class/658.562/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/1305431#Thing/zero_defects> ; # Zero defects.
   schema:bookFormat bgn:PrintBook ;
   schema:creator <http://viaf.org/viaf/43873851> ; # James F. Halpin
   schema:datePublished "1966" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/1305431> ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/567983091> ;
   schema:name "Zero defects; a new dimension in quality assurance"@en ;
   schema:productID "174315" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/174315#PublicationEvent/new_york_mcgraw_hill1966> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/1305431#Agent/mcgraw_hill> ; # McGraw-Hill
   umbel:isLike <http://bnb.data.bl.uk/id/resource/GB6704955> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/174315> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
   schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/1305431#Topic/control_de_calidad> # Control de calidad
    a schema:Intangible ;
   schema:name "Control de calidad"@en ;
    .

<http://id.worldcat.org/fast/1084966> # Quality control
    a schema:Intangible ;
   schema:name "Quality control"@en ;
    .

<http://viaf.org/viaf/43873851> # James F. Halpin
    a schema:Person ;
   schema:familyName "Halpin" ;
   schema:givenName "James F." ;
   schema:name "James F. Halpin" ;
    .

<http://www.worldcat.org/oclc/567983091>
    a schema:CreativeWork ;
   rdfs:label "Zero defects." ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/174315> ; # Zero defects; a new dimension in quality assurance
    .


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