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2006 68th ARFTG Conference : measurement for emerging technologies, 28 November-1 December 2006, Omni Interlocken Resort, Broomfield, CO.

Author: Institute of Electrical and Electronics Engineers.
Publisher: Piscataway, NJ : IEEE, [2006] ©2006
Edition/Format:   eBook : Document : English
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Institute of Electrical and Electronics Engineers.
ISBN: 1424406765 9781424406760
OCLC Number: 1053696652
Notes: Title from PDF title page (IEEE Xplore: viewed July 17 2019).
IEEE Catalog Number: 06EX1545.
Description: 1 online resource (various pagings) : illustrations
Contents: Terminology for high-speed sampling-oscilloscope calibration / Dylan F. Williams ; Tracy S. Clement ; Paul D. Hale ; Andrew Dienstfrey --
Traceability to national standards for S-parameter measurements of devices fitted with precision 1.85 mm coaxial connectors / Nick M. Ridler --
RF vector measurement test-bench for evaluation of behavioral model accuracy under realistic excitation / Maciej Myslinski ; Kate A. Remley ; Dominique Schreurs ; Bart Nauwelaers --
A behavioral power amplifier model that includes the average power level / David Wisell ; Niclas Keskitalo --
Real-time active load-pull of the 2nd & 3rd harmonics for interactive design of non-linear power amplifiers / Xian Cui ; Seok Joo Doo ; Patrick Roblin ; Gregg H. Jessen ; Roberto G. Rojas ; Jeffrey Strahler --
Validation of on-wafer vector network analyzer systems / J. Randy Fenton --
Scanning near-field microwave microscopy for spatially localized metrology of nano-scale materials and devices / Vladimir V. Talanov ; Andrew R. Schwartz --
Design of scanning capacitance microscope / Hassan Tanbakuchi ; Matt Richter ; Mike Whitener --
In-phase/quadrature covariance-matrix representation of the uncertainty of vectors and complex numbers / Dylan F. Williams ; C. M. Wang ; Uwe Arz --
A novel probe station for helium temperature measurements / H. Geissler ; A. Rumiantsev ; S. Schott ; P. Sakalas ; M. Schroter --
Broadband embedded substrate noise measurement for RF/Microwave ICs / Ming He ; William R. Eisenstadt ; Robert M. Fox --
An XML file format and a database for measurement data storage / Jean-Pierre Teyssier ; Fabien De Groote --
Comparison of multi-port VNA architectures - Measured results / Thomas Ruttan ; Brett Grossman ; Evan Fledell --
Uncertainty analysis of microwave power measurement with Monte Carlo method / Cui Xiao-hai ; Liu Xin-meng --
Using a VNA to find the 'sweet spot' when biasing a MMIC - An application / John Gregory Burns ; Christopher Ward ; George Henry ; Gregory DeSalvo --
Microwave system for drying of textile: Design, model and evaluation / Marika Pourová ; Jan Vrba ; Ondřej Žák --
A triple-frequency CW radar system for mutable-range distance measurements / S. Kitamura ; T. Araki ; T. Nagase ; M. Araki ; H. Ono --
An indirect non-invasive method for measuring input impedance and connection effects of an RFID tag antenna / Leonid Mats ; J. T. Cain ; Marlin H. Mickle --
Re-visiting the repeatability issues of the type-N connectors / Yeou-Song Brian Lee --
Verification of wafer-level calibration accuracy at cryogenic temperatures / Andrej Rumiantsev ; Ralf Doerner ; Paulius Sakalas --
Thermal equivalence error of microwave power measurement / Liu Xin-meng ; Peng Xi-yuan ; Cui Xiao-hai --
Improved evaluation of planar calibration standards using TDR preselection method / J. Vancl ; V. Sokol ; K. Hoffmann ; Z. Skvor --
Load-pull measurement of transistor negative input impedance / Fabien De Groote ; Jan Verspecht ; Jean-Pierre Teyssier ; Raymond Quéré --
A pulsed network analyzer for high dynamic range isothermal measurements / M. Marchetti ; M. Pelk ; K. Buisman ; M. Spirito ; L. C. N. de Vreede --
True pulse load-pull measurement setup for high power transistors characterization / J M Coupat ; L. Tebaldini ; J. Sirois ; B. Noori ; R. Wallace --
A new scalar microwave interferometrie measurement system / Jan Zela ; Karel Hoffmann ; Premysl Hudec --
A hybrid probe-tip calibration for multiport vector network analyzers / Leonard Hayden.
Other Titles: Measurement for emerging technologies
ARFTG 2006
2006 68th ARFTG Conference:

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Primary Entity

<http://www.worldcat.org/oclc/1053696652> # 2006 68th ARFTG Conference : measurement for emerging technologies, 28 November-1 December 2006, Omni Interlocken Resort, Broomfield, CO.
    a schema:Book, schema:MediaObject, schema:CreativeWork ;
    library:oclcnum "1053696652" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nju> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/5448976082#Topic/microwave_measurements> ; # Microwave measurements
    schema:alternateName "2006 68th ARFTG Conference:" ;
    schema:alternateName "Measurement for emerging technologies" ;
    schema:alternateName "ARFTG 2006" ;
    schema:bookFormat schema:EBook ;
    schema:contributor <http://experiment.worldcat.org/entity/work/data/5448976082#Organization/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers.
    schema:creator <http://experiment.worldcat.org/entity/work/data/5448976082#Meeting/arftg_conference_68th_2006_broomfield_colorado> ; # ARFTG Conference (68th : 2006 : Broomfield, Colorado)
    schema:datePublished "2006" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/5448976082> ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:inLanguage "en" ;
    schema:name "2006 68th ARFTG Conference : measurement for emerging technologies, 28 November-1 December 2006, Omni Interlocken Resort, Broomfield, CO."@en ;
    schema:productID "1053696652" ;
    schema:url <https://ieeexplore.ieee.org/servlet/opac?punumber=8359989> ;
    schema:workExample <http://worldcat.org/isbn/9781424406760> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/1053696652> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/5448976082#Meeting/arftg_conference_68th_2006_broomfield_colorado> # ARFTG Conference (68th : 2006 : Broomfield, Colorado)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/5448976082#Place/broomfield_colorado> ; # Broomfield, Colorado)
    schema:name "ARFTG Conference (68th : 2006 : Broomfield, Colorado)" ;
    .

<http://experiment.worldcat.org/entity/work/data/5448976082#Organization/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers.
    a schema:Organization ;
    schema:name "Institute of Electrical and Electronics Engineers." ;
    .

<http://experiment.worldcat.org/entity/work/data/5448976082#Place/broomfield_colorado> # Broomfield, Colorado)
    a schema:Place ;
    schema:name "Broomfield, Colorado)" ;
    .

<http://experiment.worldcat.org/entity/work/data/5448976082#Topic/microwave_measurements> # Microwave measurements
    a schema:Intangible ;
    schema:name "Microwave measurements"@en ;
    .

<http://worldcat.org/isbn/9781424406760>
    a schema:ProductModel ;
    schema:isbn "1424406765" ;
    schema:isbn "9781424406760" ;
    .

<http://www.worldcat.org/title/-/oclc/1053696652>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/1053696652> ; # 2006 68th ARFTG Conference : measurement for emerging technologies, 28 November-1 December 2006, Omni Interlocken Resort, Broomfield, CO.
    schema:dateModified "2019-08-03" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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